Beam profiler for large diameter and high output (infrared, receiving surface 100)
A beam profiler that covers large diameter beams with a light-receiving area of 100mm x 100mm and is capable of detecting infrared light.
The beam profiler "LaseView-LHB-100-NIR-GigE" is a model with a detection area of 100mm x 100mm. It is a large aperture model that also supports infrared. The "LaseView-LHB" series of beam profilers, designed for large aperture and high power, is an unparalleled optical product capable of measuring the largest beams in the world. It is also used for simultaneous emission evaluation of numerous LEDs and semiconductor lasers. This single unit can be used for a wide range of applications. 【Features of the LHB Series】 - Customizable according to application - Easy measurement of beam profiles and beam diameters - Capable of measuring lasers up to large apertures (1 mm to 200 mm) - Capable of measuring lasers up to high power (0.1 W/cm² to 100 W/cm²) - Equipped with speckle reduction functionality - Comes with M2 platform software (LaseView) for the beam profiler
basic information
Receiving surface dimensions: 100 mm × 100 mm Optical resolution: Approximately 800 μm Measurement power density reference: 0.1–100 W/cm² Incident power density: - Total incident power: 10W Allowable incident light angle: ±15° Measurement wavelength range: 950–1700nm (1310 nm) Effective pixel count of CCD: 320×256 Acquired image pixel count: 400×400 A/D conversion resolution: 8 / 12 bit Frame rate: 228 fps Exposure time: 0.001 ms to 10 ms Interface: GigE (RJ-45) External trigger function: - Power supply: Camera power 12V, under 10W (supplied from included AC adapter) Dimensions: W215 × H137 × D219 Weight: Under 2.5kg
Price range
Delivery Time
Model number/Brand name
LaseView-LHB-100-NIR-GigE
Applications/Examples of results
- Measurement of large diameter laser beam profiles - Measurement of high power laser beam profiles - Measurement of beam profiles of lasers with large beam divergence angles - Measurement of the far-field pattern (FFP) of lasers - Measurement of the near-field pattern (NFP) of lasers - Measurement of beam profiles of processing lasers - Measurement of beam profiles of laser scalpels - Evaluation measurement of LED continuous wave (CW) and pulsed light emission - Evaluation measurement of semiconductor laser light emission - Beam evaluation measurement of optical pickups - Measurement of the numerical aperture (NA) of optical fibers - Measurement of beam profiles, beam divergence angles, and propagation losses of lasers for satellite laser ranging using telescopes - Application to lens meters - Beam monitoring system for long-distance propagation lasers - Measurement of beam profiles of laser scanning units - Position measurement of scan lasers - Verification for LiDAR lasers - Evaluation of LiDAR - Measurement of position and beam profiles of RGB laser light sources - Verification for laser projectors