Beam profiler for large diameter and high power (wide wavelength range, light receiving area 100)
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A beam profiler that supports a wide range of wavelengths in the visible and near-infrared spectrum, covering large diameter beams with a detection area of 100×100.
The beam profiler "LaseView-LHB-100-VISNIR-GigE" is a model with a detection area of 100mm x 100mm. It supports a wide wavelength range from 400 to 1700nm. The "LaseView-LHB" series of beam profilers, designed for large diameter and high output, is an unparalleled optical product capable of measuring the largest beams in the world. It is also used for simultaneous emission evaluation of multiple LEDs and semiconductor lasers. This single device can be used for a wide range of applications. **Features of the LHB Series:** - Customizable according to application - Easy measurement of beam profiles and beam diameters - Capable of measuring lasers up to large diameters (1 mm to 200 mm) - Capable of measuring lasers up to high outputs (0.1 W/cm² to 100 W/cm²) - Equipped with speckle reduction functionality - Comes with M2 platform software (LaseView) for the beam profiler
basic information
Receiving surface dimensions: 100 mm × 100 mm Optical resolution: Approximately 300 μm Measurement power density reference: 0.1–100 W/cm² Incident power density: - Total incident power: 10W Allowable incident light angle: ±15° Measurement wavelength range: 400–1700nm (1310nm) Effective pixel count of CCD: 1280×1024 Acquired image pixel count: 1250×1250 A/D conversion resolution: 8 / 10 / 12 / 14 bit Frame rate: 130 fps (at 8 bit) Exposure time: - Interface: GigE (RJ-45) External trigger function: - Power supply: Camera power (supplied by included AC adapter) Dimensions: W215 × H137 × D219 Weight: Below 2.5kg
Price range
Delivery Time
Model number/Brand name
LaseView-LHB-100-VISNIR-GigE
Applications/Examples of results
- Measurement of large diameter laser beam profiles - Measurement of high power laser beam profiles - Measurement of beam profiles for lasers with large beam divergence angles - Measurement of the far-field pattern (FFP) of lasers - Measurement of the near-field pattern (NFP) of lasers - Measurement of beam profiles for processing lasers - Measurement of beam profiles for laser scalpels - Evaluation measurements of continuous wave (CW) and pulsed emission of LEDs - Emission evaluation measurements of semiconductor lasers - Beam evaluation measurements of optical pickups - Measurement of the numerical aperture (NA) of optical fibers - Measurement of beam profiles, beam divergence angles, and propagation losses of lasers used in satellite laser ranging systems with telescopes - Application to lens meters - Beam monitoring system for long-distance propagation lasers - Measurement of beam profiles for laser scanning units - Position measurement of scan lasers - Verification for LiDAR lasers - Evaluation of LiDAR - Measurement of position and beam profiles of RGB laser light sources - Verification for laser projectors
