Beam profiler compatible with large diameter and high output (high heat resistance, light receiving surface 100)
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A beam profiler with a large detection area of 100mm × 100mm, strong against ultra-high energy density lasers.
The beam profiler "LaseView-LHB-100-UHP" is a model with a detection area of 100mm x 100mm. It is a high-heat-resistant type that can withstand a measurement power density range of "10 to 100 kW/cm²." The "LaseView-LHB" series beam profilers, designed for large diameter and high output, are unparalleled optical products capable of measuring the largest beams in the world. They are also used for simultaneous emission evaluation of multiple LEDs and semiconductor lasers. This single unit can be used for a wide range of applications. **Features of the LHB Series:** - Customizable according to application - Easy measurement of beam profiles and beam diameters - Capable of measuring lasers up to large diameters (1 mm to 200 mm) - Capable of measuring lasers up to high outputs (0.1 W/cm² to 100 W/cm²) - Equipped with a speckle reduction function - Comes with M2 platform software (LaseView) for the beam profiler
basic information
Receiving surface dimensions: 100 mm × 100 mm Optical resolution: Approximately 200 μm Measurement power density guideline: 10–100 kW/cm² (UHP model) Incident power density: - Total incident power: Maximum 10 W Allowable incident light angle: ±15° Measurement wavelength range: 400–1100 nm (focused at specified wavelength) Effective pixel count of CCD: 2048×1536 Acquired image pixel count: 2000×2000 A/D conversion resolution: 12 bit Frame rate: 60 fps (maximum) Exposure time: 25 μs–4 s Interface: USB3.1 External trigger function: Yes (3.3–24 V) Power supply: Camera power supply 4.75–5.25V, approximately 360mA (supplied via USB), Motor power supply 6V, below 100mA (supplied via included AC adapter) Dimensions: W 208 × D 212 × H 137 Weight: Below 2.5 kg (excluding stand, cables, AC adapter)
Price range
Delivery Time
Model number/Brand name
LaseView-LHB-100-UHP
Applications/Examples of results
- Measurement of large diameter laser beam profiles - Measurement of high power laser beam profiles - Measurement of beam profiles for lasers with large beam divergence angles - Measurement of laser far-field patterns (FFP) - Measurement of laser near-field patterns (NFP) - Measurement of beam profiles for processing lasers - Measurement of beam profiles for laser scalpels - Evaluation measurements of LED continuous wave (CW) and pulsed emission - Evaluation measurements of semiconductor laser emission - Beam evaluation measurements of optical pickups - Measurement of the numerical aperture (NA) of optical fibers - Measurement of beam profiles, beam divergence angles, and propagation losses of lasers for satellite laser ranging using telescopes - Application to lens meters - Beam monitoring system for long-distance propagation lasers - Measurement of beam profiles for laser scanning units - Position measurement of scanning lasers - Verification for LiDAR lasers - Evaluation of LiDAR - Measurement of position and beam profiles of RGB laser light sources - Verification for laser projectors
