Thermal Expansion Rate Measurement Device (DIL)
Thermal Expansion Rate Measurement Device (DIL)
The TA Instruments thermal expansion measurement device is a high-precision system designed to measure dimensional changes in specimens due to fluctuations in thermal environment. We offer the optical thermal expansion measurement device "DIL Series."
1～6 item / All 6 items
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Single Sample Thermal Expansion Rate Measurement Device 'DIL801/801L'
Introducing the "DIL801," which allows measurements in air, vacuum, and inert gas purge, and the "DIL801L," which is ideal for evaluating the properties of ceramic materials.
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Differential Thermal Expansion Rate Measurement Device 'DIL802/802L'
This is an introduction to the "DIL802/802L," which is skilled in dynamic temperature programs used for shrinkage rate control sintering (RCS) and measurements in low-temperature regions.
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Dual Sample Thermal Expansion Rate Measurement Device 'DIL803/803L'
Introducing the "DIL802/802L," capable of high-precision dual sample measurement.
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Vertical Thermal Expansion Rate Measurement Device "DIL820 Series"
Measurement of thermal expansion in the vertical direction is possible! The highest sensitivity is guaranteed by a high-resolution inductive sensor (LVDT).
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Quenching Dilatometer "DIL805" for Rapid Cooling Type Thermal Expansion Rate Measurement
Achieve high-precision measurements with the "DIL805 Series," capable of advanced characteristic evaluation and optimization!
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Optical Thermal Expansion Rate Measurement Device "DIL806"
Introducing the "DIL806," capable of measuring thermal expansion rates without contact. It is an ideal tool for measuring amorphous and soft samples.
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