太洋テクノレックス 本社 和歌山 Official site

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Announcement regarding the development of an AI-equipped visual inspection system for ceramic substrates for power semiconductors by TAIYO.

太洋テクノレックス

太洋テクノレックス 本社 和歌山

Defect detection, which has been difficult until now, has become possible with AI implementation. We would like to inform you that the detection of hard-to-distinguish defects has become partially possible. Currently, verification has been completed for ceramic substrates for power semiconductors, and we will continue to improve functionality in defect detection and operational aspects. *For more details, please download the attached document.

Detection flow in AI (excerpt)
TY-VISION A308DC

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