[TAIYO] Announcement of the release of the appearance inspection device 'TY-VISION M111SC' with enhanced detection of fine defects, featuring an optical resolution of 2.5μm.
太洋テクノレックス 本社 和歌山
We are advancing the development of high-performance for our appearance inspection system, the "TY-VISION series," and we are pleased to announce the completion of the appearance inspection device "TY-VISION M111SC," which is equipped with an optical system featuring an optical resolution of 2.5μm. In recent years, driven by the further expansion of DX and IoT, the spread of 5G communication networks, and the advancement of digitalization in society, as well as the transformation of the automotive industry with the progress of autonomous driving and electrification, the semiconductor market continues to thrive. The quality levels of various substrates are rising, particularly for high-definition substrates, and we have developed the "TY-VISION M111SC" to meet market demands. Please refer to the attached file for more details.
