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Notice of Participation in the 27th Automatic Recognition Comprehensive Exhibition
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Tech Frontier 2025 7th Connected Factory Promotion Exhibition Participation Information
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[Press Release] "APT-2600FD" wins the 55th Industrial Design Award IDEA, commemorating the 110th anniversary of the Nikkan Kogyo Shimbun.
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NSW Function - Short Circuit/Open Circuit Fault Detection
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Inspection Program Creation Support - ALL CAD Conversion Software
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[Press Release] Takaya Corporation's Flying Probe Tester Wins the "Technology Award" from the Electronics Packaging Society.
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[Press Release] Exhibiting at the "Total Solution Exhibition for Electronic Devices 2025" *Received the Encouragement Award at the 21st JPCA Awards!
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41st Comprehensive Exhibition of Distribution Information Systems "RetailTech JAPAN 2025" Exhibition and Exhibit Information
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[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"
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[Press Release] Takaya Corporation and Estakaya Electronics Co., Ltd. Exhibit at the 1st [Kansai] Nepcon Japan
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[Press Release] Takaya Corporation to Exhibit at the 39th NEPCON Japan
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RFID × IoT Data Service RFID Work Performance Collection System
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Notice of Participation and Exhibits for the 26th Library Comprehensive Exhibition 2024
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Invitation to Exhibit at the 26th Automatic Recognition Comprehensive Exhibition
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Hybrid inspection system combining JTAG testing and flying probe testers.
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Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning (Joint Research Report with Ehime University)
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Notice of Participation and Exhibits for the 32nd Security and Safety Management Comprehensive Exhibition "SECURITY SHOW 2024"
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Product shelves for unmanned stores + theft prevention system
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Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers
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![[Press Release] "APT-2600FD" wins the 55th Industrial Design Award IDEA, commemorating the 110th anniversary of the Nikkan Kogyo Shimbun.](https://image.mono.ipros.com/public/catalog/image/01/895/812133/IPROS15639860864824493506.jpeg?w=120&h=170)
![[Press Release] Takaya Corporation's Flying Probe Tester Wins the "Technology Award" from the Electronics Packaging Society.](https://image.mono.ipros.com/public/catalog/image/01/c00/806751/IPROS12471010888207753779.jpeg?w=120&h=170)
![[Press Release] Exhibiting at the "Total Solution Exhibition for Electronic Devices 2025" *Received the Encouragement Award at the 21st JPCA Awards!](https://image.mono.ipros.com/public/catalog/image/01/9ae/806733/IPROS13092888282314335159.jpeg?w=120&h=170)
![[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"](https://image.mono.ipros.com/public/catalog/image/01/ff3/783618/IPROS14580097868979274668.jpeg?w=120&h=170)
![[Press Release] Takaya Corporation and Estakaya Electronics Co., Ltd. Exhibit at the 1st [Kansai] Nepcon Japan](https://image.mono.ipros.com/public/catalog/image/01/713/805014/IPROS436699664173999555.jpeg?w=120&h=170)
![[Press Release] Takaya Corporation to Exhibit at the 39th NEPCON Japan](https://image.mono.ipros.com/public/catalog/image/01/3ce/794367/IPROS9804424106637358618.jpeg?w=120&h=170)
![APT-2400F Series [Chinese Version]](https://image.mono.ipros.com/public/catalog/image/01/ba1/800375/IPROS9730804481540119964.jpeg?w=120&h=170)
