TAKAYA Corporation Official site

  • OTHER

Regarding the joint research report presentation with Ehime University (JPCA Show 2023 / 2023 Microelectronics Show)

TAKAYA Corporation

TAKAYA Corporation

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on accelerating the inspection of flying probe testers using deep reinforcement learning. We are pleased to announce that a report on this research will be displayed and introduced at the Ehime University Graduate School booth during the JPCA Show 2023 / 2023 Microelectronics Show, which will be held from May 31 (Wednesday) to June 2 (Friday) at Tokyo Big Sight, East Exhibition Hall and Conference Hall. We hope that everyone attending the JPCA Show will take the opportunity to visit the Ehime University booth. The location of the Ehime University Graduate School booth is as follows: Booth Number: 3B-14 Exhibition: 2023 Microelectronics Show Exhibition Zone: Academic Plaza

Related Links

JPCA Show/Microelectronics Show/JISSO PROTEC/SDGs Device Exhibition/WIRE Japan Show/JEP/TEP Show/E-Textile/Smart Sensing/Unmanned Solutions Exhibition/interOpto/Imaging Japan/Edge Computing Ehime University

Related catalog

Flying Probe Tester APT-1340J/APT-1400F-SL

PRODUCT

Dual-Side Flying Probe Tester APT-1600FD

PRODUCT