Notice of Joint Research Report and Seminar Presentation with Ehime University (JPCA Show 2024 / 2024 Microelectronics Show)

TAKAYA Corporation

Takaya Corporation is conducting joint research with the Graduate School of Science and Engineering at Ehime University on "Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning." We are pleased to announce that a report on this research will be displayed and introduced at the Ehime University booth during the JPCA Show 2024 / 2024 Microelectronics Show, which will be held from June 12 (Wednesday) to June 14 (Friday) at Tokyo Big Sight. Additionally, a seminar presentation related to this topic will take place on June 14 (Friday) at the venue. Takaya will also be exhibiting at the same exhibition, showcasing a real flying probe tester. We hope that all attendees will visit the booth and seminar venue. *Ehime University Booth Booth Number: 3B-56 (Academic Plaza) *Seminar Date and Time: June 14 (Friday) 13:20-13:40 Venue: Seminar Room E Session: 3DMID Seminar / Academic Plaza *Takaya Corporation Booth Booth Number: 4C-38 (Hall 4 East)

Date and time Wednesday, Jun 12, 2024 ～ Friday, Jun 14, 2024
10:00 AM ～ 05:00 PM
Capital Tokyo Big Sight
Entry fee Free Advance registration is required via the link.

Related product information

Dual Side Flying Probe Tester: APT-1600FD
This is a flagship model that arranges probe heads on both the top and bottom, enabling simultaneous in-circuit testing of the front and back of the substrate.

To ensure that electronic devices function correctly, the electronic circuit board within the device must operate normally. The electronic circuit board becomes operational when electronic components are correctly mounted on the printed circuit board (PCB) and power is supplied. The process of contacting a dedicated probe to the electronic circuit board, which has electronic components mounted, and applying minute electrical signals for testing is called In-Circuit Testing (ICT), and the device used for this testing is referred to as an In-Circuit Tester. This method allows for the inspection of "connection reliability between electronic components and the board," "the values of individual mounted electronic components (such as resistors and capacitors)," and "diode polarity," without imposing unnecessary loads on the board itself. It is also known as MDA (Manufacturing Defect Analyzer). Main inspection items include: - Solder shorts and opens - Pattern disconnections - Missing components - Incorrect component values - Reverse insertion of polarized components - Lifted leads of ICs and connectors - Operation confirmation of digital transistors, optocouplers, and Zener diodes - Other simple function tests.
Multi-Probe System (Exclusive Option for 1600/2600FD)
Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.

Takaya is highly regarded as a leading manufacturer of flying probe testers representing Japan, receiving acclaim in countries around the world. Its areas of activity extend not only to the home appliance industry but also to the medical device industry and the automotive industry, which require high quality standards, as well as the aerospace industry, which has very high entry barriers.
Optimal for electrical testing of mass-produced PCBs (ICT)!! Introduction of the inline model.
The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing.

- Automatic adjustment of conveyor width based on the size of the inspection target board - Automatic notification of inspection status via email - Interoperability with IT systems compliant with the OPC UA standard - Split inspection of large long boards into multiple sections (maximum inspectable size: 985x610mm) We also offer various expansion options. Feel free to consult us for trials/tests. If you have any concerns, please do not hesitate to contact us.
Integration features with MES systems compatible with the international standard OPC UA.
Exhibiting at Nepcon 2024 from January 24! Achieving interoperability between industrial equipment and MES systems!

We will be exhibiting the above demo at this exhibition. Please be sure to check out the actual product. 【Exhibition Name】38th NEPCON Japan - Electronics Development and Manufacturing Expo - 【Date】January 24, 2024 [Wednesday] to January 26, 2024 [Friday] 【Time】10:00 AM to 5:00 PM 【Venue】Tokyo Big Sight 【Organizer】RX Japan Co., Ltd.