An article introducing our product "APT-2600FD" has been published in EE Times Japan.

TAKAYA Corporation

Our flying probe in-circuit tester "APT-2600FD," which we exhibited at the "JPCA Show 2025," has been featured in the electronics specialized media "EE Times Japan." This product has received the Encouragement Award at the 21st JPCA Awards and garnered significant attention at the exhibition. The article provides detailed coverage of the product's features and technical advantages. Please see the related links below. Moving forward, Takaya will continue to contribute to the improvement of manufacturing quality through the development of advanced inspection technologies.

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Flying Probe Tester APT-2400F / 2600FD
2025 Electronics Packaging Society Technical Award Winner!" "55th Mechanical Industry Design Award IDEA Winner!

In the electronic circuit board manufacturing industry, there is a trend towards higher performance and miniaturization, requiring the implementation of numerous components in limited spaces, and the demands for inspection accuracy and efficiency are increasing. Our latest model, the "APT-2400F/APT-2600FD series," is a groundbreaking inspection device developed to meet these industry needs by consolidating top-class technology. Key features of the new model: 1. Comprehensive design of all hardware and software in-house 2. Newly developed motor system and inspection probe mechanism 3. CMOS color camera with liquid lens 4. Remote camera 5. Automatic cleaner for inspection probes (optional) 6. Temperature sensor (optional) 7. Universal design 8. Versatile expansion features to meet a wide range of industry needs *For more details, please download the PDF document or feel free to contact us.

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Flying Probe Tester APT-2400F

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