ナノフォーカス 3次元X線CTシステム XVA-160RA

ナノフォーカス 3次元X線CTシステム XVA-160RA
ナノフォーカス 3次元X線CTシステム XVA-160RAについて
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3D X-ray CT system 'XVA-160RA/160αII "Z"'
Easily achieve high magnification observation with our unique technology "User-Centric Mechanism." We support the discovery and analysis of defects in implementation boards and semiconductor devices.
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X-ray measurement technology: U-centric function
Don't miss the key points! Even during detector tilting, magnification, and stage rotation, it continues to keep the sample centered.
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X-ray measurement technology: 3D oblique CT
Oblique angle imaging allows for tomographic imaging without damaging large substrates! High operability has also been achieved.
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Cone Beam CT (Computed Tomography) using X-ray measurement technology
Ideal for analyzing small components with a low aspect ratio! It enables precise and clear tomography imaging.
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