[Online Seminar] Solutions for Realizing Cutting-Edge Semiconductor Products! New Proposals for Nano-Level Thickness Measurement and Shape Inspection (March 12)

マーポス株式会社

We will hold an online seminar as follows. In the continuously evolving semiconductor industry, the cutting-edge "next-generation semiconductors," which are currently advancing in miniaturization and integration, are attracting particular attention. Along with this, in the latest semiconductor manufacturing processes, it is essential to perform thickness control and shape measurement without causing damage such as scratches or contamination, and there is an increasing need for precise and accurate measurement techniques. In this seminar, we will introduce solutions for realizing cutting-edge semiconductor products, including a new application for thickness measurement using contact and non-contact sensors called "P3CF," as well as examples of nano-level thickness measurement and surface shape measurement (topography, warpage, etc.) using non-contact sensors. Date and Time: March 12, 2024 (Tuesday) 14:00 - 15:00 Instructor: Semiconductor Industrial Manager, Sales Development Department, Marpos Co., Ltd. Recommended for: - Customers engaged in semiconductor manufacturing - Customers facing challenges in wafer thickness measurement - Customers with issues in surface shape or dimensional measurement in semiconductor manufacturing processes How to apply: Please register using the application form below.

Date and time 2024年03月12日（火）
14:00 ～ 15:00
Zoom Webinar
Capital
Entry fee 無料

Related product information

Optical Interference Measuring Instrument 'NCG'
Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

【Other Features】 ■ Designed for versatility and ease of use ■ Each individual unit controlled by the machine can be connected through a network of sensors ■ Unique technology allows for the measurement of various components (highly reflective, rough surfaces, opaque materials, etc.) ■ Improved electronics unit enables the storage of continuous data during measurements, which can be used for post-process measurement details, quality control, and machine performance evaluation *For more details, please refer to the PDF document or feel free to contact us.
Chromatic confocal technology, non-contact measurement for thickness measurement.
It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.

【Catalog Contents】 ■ Chromatic Confocal Principle ■ ChromaPoint Sensor Head ■ ChromaPoint Controller ■ ChromaLine Sensor Head ■ ChromaLine Controller ■ ChromaVision Camera ■ Application Examples (Various Distance, Thickness Measurement, Surface Roughness Measurement, Quality Control) ■ Glossary ■ Contact Us *For more details, please refer to the PDF document or feel free to contact us.