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MIL-STD-883K
We will conduct the shock test for integrated circuits as specified in MIL-STD-883K.
1. Overview of MIL-STD-883K: ● MIL-STD-883K is a specification for test methods and procedures for integrated circuits (microelectronics devices), outlining general requirements for military procurement, as well as mechanical, environmental, durability tests, electrical test methods, and quality assurance methods and procedures. The tested integrated circuits include semiconductor components and items such as monolithic, multi-chip, film, and hybrid ultra-small circuits. ● Our company can accommodate the MIL-STD-883K METHOD 2002.5 MECHANICAL SHOCK with a g level (peak) of 10,000G – Duration of pulse 0.2msec within a tolerance of ±0.1msec, with a response capability of 0.1msec. ▼ For more details, please download the PDF document (recommended). ▼ Customers in a hurry, please contact us via the 'Inquiry' section below.
basic information
2. METHOD 2002.5 MECHANICAL SHOCK Test Procedure: - The test specimen should be placed horizontally on a sturdy table or an equivalent base. - The test specimen must be securely mounted to prevent "bouncing" during repeated shocks. - Select the g level (peak) and apply it five times each in the X1, X2, Y2, Y1, Z1, and Z2 directions. - Unless otherwise specified, condition B shall be applied. - Allowable range for action time: ±0.1 msec or ±30% of the higher value.
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For more details, please download the PDF document or feel free to contact us using the "Contact Us" section below.
