Notice of Participation in SEMICON Japan 2021 Hybrid

マーポス

Our company will be exhibiting at "SEMICON Japan 2021 Hybrid" held at Tokyo Big Sight starting from Wednesday, December 15, 2021. (Booth number: 1720) At this exhibition, we will mainly showcase semiconductor industry-specific applications and non-contact measuring instruments related to the improvement of reliability and performance in semiconductor manufacturing processes. We sincerely look forward to seeing you at our booth. Exhibited products: - Non-contact thickness measurement gauge (interferometry technology) - Non-contact distance/thickness measuring instrument (chromatic confocal technology) - Laser outer diameter measurement gauge, etc.

Date and time Wednesday, Dec 15, 2021 ～ Friday, Dec 17, 2021
10:00 AM ～ 05:00 PM
Pre-registration is required for entry to this exhibition.
Capital Tokyo Big Sight (East Exhibition Hall)
Entry fee Free Entry to this exhibition requires prior registration.

Related product information

Optical Interference Measuring Instrument 'NCG'
Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

【Other Features】 ■ Designed for versatility and ease of use ■ Each individual unit controlled by the machine can be connected through a network of sensors ■ Unique technology allows for the measurement of various components (highly reflective, rough surfaces, opaque materials, etc.) ■ Improved electronics unit enables the storage of continuous data during measurements, which can be used for post-process measurement details, quality control, and machine performance evaluation *For more details, please refer to the PDF document or feel free to contact us.
Non-contact measurement solution for film thickness measurement 'IRIX'
A non-contact sensor using chromatic confocal technology measures the distance and thickness of various materials that transmit white light.

【Catalog Contents (Excerpt)】 <Optical Pen> ■Measurement Range ■Operating Distance ■Maximum Object Inclination ■Axial Model ■Radial Model ▼Currently on display at the Marposs EV Virtual Showroom! We invite you to visit!▼ https://www.marposs.com/vs/ev/jpn/index.htm *For more details, please refer to the PDF document or feel free to contact us.
Laser System "WIRELINE.XY"
High-precision and reliable wire diameter measurement without the need for frequent gauge cleaning! The quality of molded products and process capability is demonstrated in printed reports.

【Main Features】 ■ Measurement and display of outer diameter and ellipse ■ Tolerance out alarm ■ Processing and printing of statistical reports ■ Interface with remote computer *For more details, please refer to the PDF document or feel free to contact us.