Optical Interference Measuring Instrument 'NCG'

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

The "NCG" is a thickness measurement device using optical interference technology. It calculates and measures the thickness of layers through the interference caused by the reflection of light waves at the joint surface of the workpiece. It is designed to manage the thickness of different materials such as glass, plastic, and silicon wafers. This product can be connected to various machines, allowing for high-precision and high-speed management of component thickness, and can be used in dry or wet environments within the specified limits of the specifications, either on the machine or inside the machine. 【Features】 ■ Guarantees processing accuracy within the desired tolerance ■ Reduces cycle time ■ Control for maintaining stable production under controlled conditions ■ Compensation for mechanical variations ■ History of measurement results *For more details, please refer to the PDF document or feel free to contact us.

basic information

【Other Features】 ■ Designed for versatility and ease of use ■ Each individual unit controlled by the machine can be connected through a network of sensors ■ Unique technology allows for the measurement of various components (highly reflective, rough surfaces, opaque materials, etc.) ■ Improved electronics unit enables the storage of continuous data during measurements, which can be used for post-process measurement details, quality control, and machine performance evaluation *For more details, please refer to the PDF document or feel free to contact us.

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Applications/Examples of results

【Typical Applications】 ■ Measurement of different silicon types and sapphire wafer thickness ■ Processing processes on the background and lap machine ■ Detection of thin film layers and thick film layers ■ Tape thickness management *For more details, please refer to the PDF document or feel free to contact us.