Non-contact measuring device

Non-contact measuring device
Introducing the non-contact measuring instrument from Marpos.
1~25 item / All 25 items
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A film weight measurement system using ultrasound without radiation.
Achieve non-contact measurement of the weight per unit area of film and sheet materials. The lighter the film, the higher the measurement accuracy! Suitable for thin film extrusion and coating applications. [*Sample testing available*]
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High-precision non-contact measurement system "OptoQuick"
Supports on-site productivity with a superior balance of measurement performance, speed, and versatility.
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Small non-contact measuring device "OptoFlash"
Achieve high-precision non-contact measurement in seconds <Test measurement of workpieces available (please inquire)>
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Biomedical | Testing, Measurement, and Inspection Products for Implants
Ideal for screw testing for implants and measuring screw threads! We offer "confocal sensors" and more.
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Chromatic confocal technology, non-contact measurement for thickness measurement.
It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.
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CCD camera-equipped non-contact tool measurement system 'VTS SF-45'
Achieved significant miniaturization while maintaining top-class repeatability and measurement performance. Can be installed in limited spaces such as mold processing machines and precision machining equipment.
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3D Precision Inspection Solution "OptoCloud EDU"
Quality assurance process for electric drive units. Complete verification of 240 electrical contacts of the motor stator in just 30 seconds.
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Laser system "Extruline.XY"
Automatically control the extruder to stay within tolerance limits! High-performance feedback is possible with a 2-axis gauge.
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Laser System "WIRELINE.XY"
High-precision and reliable wire diameter measurement without the need for frequent gauge cleaning! The quality of molded products and process capability is demonstrated in printed reports.
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Laser Micrometer "SUPER-WIRELAB.XY"
The adoption of advanced laser technology enables ultra-precise and completely reproducible measurements!
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Laser Micrometer "WIRELAB.XY"
Adopting high-quality components and solid-state laser diodes!
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Laser Micrometer "SUPER-MECLAB+.X"
High flexibility! Capable of measuring various components and dimensions without gauge remastering.
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Laser system "QUADRALINE.XY"
Improving product quality and reducing waste! The quality and process capability of molded products can be verified through printed reports.
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Laser Micrometer 'SUPER-MECLAB+.T40'
Benchtop type! Can be used easily and quickly, reducing inspection time and improving measurement performance.
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Grindline.X Laser System
Introducing a laser system for single diameter measurement/grinding machine control using through-feed.
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Grindline+.X Laser System
The non-contact measurement principle allows for all inspections to be conducted without stopping the line.
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Non-contact portable optical micrometer 'HWS.3'
It is possible to measure wires, cables, and other similar products!
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Optical Interference Measuring Instrument 'NCG'
Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.
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Dicing Machine Sensor "VBI (Blade Inspection System)"
Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.
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Contact/Non-contact Hybrid Thickness Measurement Application 'P3CF'
Realizing non-contact thickness measurement of various materials that transmit white light.
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CCD camera-equipped non-contact tool measurement system 'VTS WF'
Expanding the measurement area while maintaining top-class repeatability and measurement performance. Ideal for measuring grinding tools and special-shaped tools, as well as wear management.
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High-precision non-contact gauge for measuring nano-layer film thickness 'NCG-R'
Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).
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Interferometer Controller "HORIZON"
Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.
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Die-cast mold surface temperature monitoring system "TTV"
Easily manage the surface temperature of molds! Contributes to the stabilization of die-cast product quality (compatible with mega/giga casting) [*Demo available].
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Simultaneous evaluation of hundreds of small component measurement items in 30 seconds - 'OptoCloud S'
Utilizing 3D reconstruction technology, it is possible to perform measurements of hundreds of items in 30 seconds.
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