Optical Interference Measuring Instrument 'NCG'

Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

last updated Feb 04, 2025

High-precision non-contact gauge for measuring nano-layer film thickness 'NCG-R'

Thickness measurement is possible from thick wafers to ultra-thin wafers (less than 1μm).

last updated Nov 21, 2025

Interferometer Controller "HORIZON"

Using interferometric (interferometer) technology, it is possible to measure the thickness of transparent and opaque films.

last updated Jan 15, 2026

Dicing Machine Sensor "VBI (Blade Inspection System)"

Achieving reduced cycle time in chip manufacturing and high quality! Sensors for blade monitoring during wafer cutting.

last updated Nov 18, 2025

Contact/Non-contact Hybrid Thickness Measurement Application 'P3CF'

Realizing non-contact thickness measurement of various materials that transmit white light.

last updated Feb 13, 2025

Chromatic confocal technology, non-contact measurement for thickness measurement.

It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.

last updated Feb 12, 2025

Collision monitoring and machine protection module 'GEMCMS'

When a collision occurs, the stop signal is activated within 1 ms! It minimizes damage as much as possible.

last updated Feb 20, 2026

CCD camera-equipped non-contact tool measurement system 'VTS SF-45'

Achieved significant miniaturization while maintaining top-class repeatability and measurement performance. Can be installed in limited spaces such as mold processing machines and precision machining equipment.

last updated Jan 06, 2026