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[Analysis Case] Cross-sectional Observation of Organic EL (OLED) and Gate Oxide Film using TEM and SEM_C0090
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[Analysis Case] Condition Assessment of Highly Degraded Organic Materials_C0186
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[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Element Stacked Film_C0067
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[Analysis Case] Depth Direction Analysis of Degradation Components in Organic Materials Using GCIB (Ar Cluster) _C0241
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[Analysis Case] High-Precision Evaluation of Impurity Concentration in AlGaN UV Sensors Using SIMS_C0232
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[Analysis Case] Degradation Analysis of Organic EL Devices using MSDM (Mass Spectra Depth Mapping) _C0413
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[Analysis Case] Evaluation of Organic EL Devices Using MSDM (Mass Spectra Depth Mapping) C0411
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[Analysis Case] Depth Profile Concentration Analysis of Impurities in GaN-based LED Structures Using SIMS_C0251
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[Analysis Case] Evaluation of Element Distribution in Textured GaN-based LEDs_C0248
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[Analysis Case] Evaluation of Ga and Al Diffusion into Si Substrate Using SSDP-SIMS_C0267
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[Analysis Case] Visualization of Strain at Heterojunction Interface of Compounds_C0010
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一般財団法人材料科学技術振興財団 MST
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![[Analysis Case] Comprehensive Evaluation of Lighting Emitting Devices_C0160](https://image.mono.ipros.com/public/catalog/image_generated/01/7af/210219/210219_IPROS6178323617116533259_1.jpg?w=120&h=170)
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![[Analysis Case] Depth Direction Analysis of Degradation Components in Organic Materials Using GCIB (Ar Cluster) _C0241](https://image.mono.ipros.com/public/catalog/image/01/42b/333619/IPROS341958644773503141.jpg?w=120&h=170)
![[Analysis Case] High-Precision Evaluation of Impurity Concentration in AlGaN UV Sensors Using SIMS_C0232](https://image.mono.ipros.com/public/catalog/image/01/452/333611/IPROS9214484088616122838.jpg?w=120&h=170)
![[Analysis Case] Degradation Analysis of Organic EL Devices using MSDM (Mass Spectra Depth Mapping) _C0413](https://image.mono.ipros.com/public/catalog/image/01/f72/335974/IPROS1576801011353801905.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Organic EL Devices Using MSDM (Mass Spectra Depth Mapping) C0411](https://image.mono.ipros.com/public/catalog/image/01/f0c/335830/IPROS6705579921419628462.jpg?w=120&h=170)
![[Analysis Case] Composition Analysis of Compound Semiconductors by SIMS_C0288](https://image.mono.ipros.com/public/catalog/image/01/1cb/334735/IPROS612723902110858376.jpg?w=120&h=170)
![[Analysis Case] SSDP-SIMS Analysis of Mg in GaN-based LED Structure_C0293](https://image.mono.ipros.com/public/catalog/image/01/c8d/334722/IPROS9135988173715918097.jpg?w=120&h=170)
![[Analysis Case] Quality Evaluation of SiC Substrates_C0280](https://image.mono.ipros.com/public/catalog/image/01/13c/334696/IPROS77783990163959754524.jpeg?w=120&h=170)
![[Analysis Case] Depth Profile Concentration Analysis of Impurities in GaN-based LED Structures Using SIMS_C0251](https://image.mono.ipros.com/public/catalog/image/01/a8c/334693/IPROS8414471342007927826.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Element Distribution in Textured GaN-based LEDs_C0248](https://image.mono.ipros.com/public/catalog/image/01/5b4/334636/IPROS6207553116828601953.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Ga and Al Diffusion into Si Substrate Using SSDP-SIMS_C0267](https://image.mono.ipros.com/public/catalog/image/01/ba6/334635/IPROS45683494058701876967.jpeg?w=120&h=170)
![[Analysis Case] SIMS Measurement of Special-Shaped Samples_C0266](https://image.mono.ipros.com/public/catalog/image/01/5ce/334625/IPROS32963134302969716210.jpeg?w=120&h=170)
![[Analysis Case] Photoluminescence Analysis of White LEDs_C0253](https://image.mono.ipros.com/public/catalog/image/01/4b0/333667/IPROS4745154231841090818.jpg?w=120&h=170)
![[Analysis Case] Depth Direction Analysis of Polyimide Components_C0242](https://image.mono.ipros.com/public/catalog/image/01/99d/333622/IPROS43833534864070848294.jpeg?w=120&h=170)
![[Analysis Case] Comprehensive Evaluation of Organic EL Display_C0134](https://image.mono.ipros.com/public/catalog/image_generated/01/13d/210228/210228_IPROS5561488674861738653_1.jpg?w=120&h=170)
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