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[Analysis Case] Evaluation of Element Distribution in the Operating Area of Oxide ReRAM Using SIMS_C0191
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[Analysis Case] Composition and Thickness Evaluation of Ultra-Thin SiON Film_C0002
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[Analysis Case] Evaluation of Metal Element Concentration Near the Surface of Gallium Oxide Ga2O3 Film_C0440
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[Analysis Case] Composition and Impurity Analysis of Thin Film, Bulk, and Powder Materials_C0314
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[Analysis Case] Observation of Crystal Structure of Multicomponent Metal Nanoparticles by TEM_C0116
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[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy_C0514
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[Analysis Case] Verification of Reduction Treatment for Sn Oxide - Comparison of XPS and Computational Simulation - C0544
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[Analysis Case] Evaluation of Composition and Bonding State of GaN Film by XPS_C0381
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[Analysis Case] Evaluation of Crystal Structure Using a Combination of STEM/EDX Data and Image Simulation_C0558
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一般財団法人材料科学技術振興財団 MST
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![[Analysis Case] Evaluation of Element Distribution in the Operating Area of Oxide ReRAM Using SIMS_C0191](https://image.mono.ipros.com/public/catalog/image_generated/01/e57/210185/210185_IPROS2725513035132995963_1.jpg?w=120&h=170)
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![[Analysis Case] Removal of Organic Contaminants by Etching_C0383](https://image.mono.ipros.com/public/catalog/image/01/305/335365/IPROS23107648182936016829.jpeg?w=120&h=170)
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![[Analysis Case] Evaluation of the Chemical State of IGZO Film_C0331](https://image.mono.ipros.com/public/catalog/image/01/7f6/334965/IPROS01804357987500460565.jpeg?w=120&h=170)
![[Analysis Case] Local Crystal Structure Analysis of IGZO Film_C0330](https://image.mono.ipros.com/public/catalog/image/01/762/334964/IPROS17030823312641878789.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of Ti Diffusion into IGZO Film_C0329](https://image.mono.ipros.com/public/catalog/image/01/0e7/334963/IPROS23387886746062139567.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of H Concentration in IGZO Film_C0328](https://image.mono.ipros.com/public/catalog/image/01/b04/334961/IPROS18456182799046763692.jpeg?w=120&h=170)
![[Analysis Case] Local Structure Analysis of IGZO Thin Film by XAFS_C0324](https://image.mono.ipros.com/public/catalog/image/01/9c2/334960/IPROS9187373790045320382.jpg?w=120&h=170)
![[Analysis Case] Composition and Impurity Analysis of Thin Film, Bulk, and Powder Materials_C0314](https://image.mono.ipros.com/public/catalog/image/01/584/334797/IPROS40829894613253686033.jpeg?w=120&h=170)
![[Analysis Case] IGZO Thin Film Crystallinity and Film Density Evaluation_C0283](https://image.mono.ipros.com/public/catalog/image/01/bdb/265402/IPROS4276913027028575623.jpg?w=120&h=170)
![[Analysis Case] Band Gap Evaluation of Oxidized and Nitrided Thin Films_C0462](https://image.mono.ipros.com/public/catalog/image/01/eba/369536/IPROS76187887167628431145.jpeg?w=120&h=170)
![[Analysis Case] Observation of Crystal Structure of Multicomponent Metal Nanoparticles by TEM_C0116](https://image.mono.ipros.com/public/catalog/image/01/b7e/210237/IPROS8347525306860253548.jpg?w=120&h=170)
![[Analysis Case] Measurement of Partial Density of States for GaN_C0511](https://image.mono.ipros.com/public/catalog/image/01/2ce/405535/IPROS87036317300190245882.jpeg?w=120&h=170)
![[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy_C0514](https://image.mono.ipros.com/public/catalog/image/01/728/408736/IPROS6347678897679507317.jpg?w=120&h=170)
![[Analysis Case] Verification of Reduction Treatment for Sn Oxide - Comparison of XPS and Computational Simulation - C0544](https://image.mono.ipros.com/public/catalog/image/01/7ba/454981/IPROS15359602513076695467.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Composition and Bonding State of GaN Film by XPS_C0381](https://image.mono.ipros.com/public/catalog/image/01/195/335358/IPROS25646807978241647886.jpeg?w=120&h=170)
![[Analysis Case] Composite Evaluation of Zn-based Buffer Layer by X-ray_C0282](https://image.mono.ipros.com/public/catalog/image/01/2f9/334786/IPROS17112372642578760995.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Metal Films by High-Temperature XRD_C0270](https://image.mono.ipros.com/public/catalog/image/01/896/334779/IPROS17420989001213370696.jpg?w=120&h=170)
![[Analysis Case] Evaluation of Crystal Structure Using a Combination of STEM/EDX Data and Image Simulation_C0558](https://image.mono.ipros.com/public/catalog/image/01/02e/458116/IPROS12397552870945855898.jpg?w=120&h=170)