【分析事例】電子部品

【分析事例】電子部品
電子部品の分析事例をご紹介します
31~60 件を表示 / 全 117 件
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[Analysis Case] Evaluation of Copper (Cu) Oxide Film Thickness: Differences Due to Storage Environment
It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.
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[Analysis Case] Evaluation of Layer Structure and Film Thickness of Naturally Oxidized Copper (Cu) Surface Film
Depth-direction state evaluation using TOF-SIMS.
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[Analysis Case] Depth Direction Analysis of Thin Carbon Films
Depth-direction analysis of diamond-like carbon (DLC) and graphene is possible.
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[Analysis Case] High-Precision Quantification of the sp2/(sp2+sp3) Ratio of DLC Films
High-precision analysis using XAFS
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[Analysis Case] Evaluation of the sp2/(sp2+sp3) Ratio of DLC Films
Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.
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[Analysis Case] Evaluation of Work Function After Thin Film Surface Treatment
UPS analysis after surface plasma treatment of ITO.
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Valence evaluation of metal oxides by chemical shift
XPS: X-ray Photoelectron Spectroscopy
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Evaluation of the orientation angle of organic film materials
XAFS: X-ray Absorption Fine Structure
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Types and Characteristics of Electron Diffraction
TEM: Transmission Electron Microscopy
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Detection of trace components by P&T of volatile organic compounds (VOCs)
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Surface Contamination Assessment of Si Wafers Stored Using TOF-SIMS
Evaluation of contamination and oxidation of Si wafers after removing the oxide film with hydrofluoric acid treatment.
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[Analysis Case] Qualitative Analysis of Powder Contaminants
By combining techniques, it is possible to obtain multiple types of component information.
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[Analysis Case] Evaluation of the Condition of Foreign Matter with Surface Oxidation Film
Evaluation of aluminum hydroxide Al(OH)3 and aluminum oxide Al2O3 is possible.
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[Analysis Case] Structural Analysis of Polyimide Resin
Structural analysis of polyimide resin is possible using thermal decomposition GC/MS method.
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[Analysis Case] Low-Temperature PL Spectrum of Si After Ion Implantation Annealing Treatment
It is possible to confirm the recovery of crystallinity due to irradiation defects and annealing.
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[Analysis Case] Analysis of Corrosive Components in Indoor Atmosphere
It is possible to analyze ion components in the atmosphere using the impinger collection method.
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Gas analysis using the heart-cut EGA method.
GC/MS: Gas Chromatography-Mass Spectrometry
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[Analysis Case] Evaluation of Silicon Oxide Film by XAFS
Local structural analysis around silicon, quantification of intermediate oxides, evaluation of bulk and interfaces.
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[Analysis Case] Evaluation of the Depth Distribution of B near the Si Surface using SIMS
High-precision B profile analysis through sample cooling.
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[Analysis Case] Structural Evaluation of Carbon Films
Evaluation of structural specificity, crystallinity, and sp3 characteristics.
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[Analysis Case] Evaluation of Flux Cleaning Residue
We capture the minute and ultra-thin residue as an image.
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[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards
Reduce the impact of foreign object surrounding information with appropriate sampling.
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[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards
Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.
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Analysis of eluted components from printed circuit boards.
It is possible to analyze cation components in liquid samples.
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[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS
Properly sampling and measuring surface contamination even on large parts that cannot be cut.
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[Analysis Case] Observation of the Surface Morphology of ZnO Films
Capable of observing large-area surface shapes.
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[Analysis Case] Evaluation of Organic Residue Amount in Cleaning Rinse Solution
Evaluation using TOC and LC/MS/MS is possible!
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[Analysis Case] Observation of Crosshatch Pattern Shape
It is possible to visualize small irregularities with high vertical resolution.
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[Analysis Case] Evaluation of Damage Layer on Polymer Surface Due to Ion Irradiation
By using GCIB (Ar cluster), it is possible to evaluate the composition and thickness of the damaged layer.
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Micro-sampling method
FIB: Focused Ion Beam Processing
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