[Analysis Case] Investigation of Voids Inside Bonded Wafers Using C-SAM

We will evaluate the internal structure of the device in a comprehensive manner.

last updated Mar 14, 2025

[Analysis Case] Component Analysis of Flux in Cream Solder

Comprehensively qualitatively analyzes the rosin, thixotropic agents, surfactants, and other components in cream solder.

last updated Mar 13, 2025

[Analysis Case] Analysis of Epoxy Resin Hardener

Structural estimation of the curing agent component of a two-component epoxy resin.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

Separation of components in the Cu spectrum, quantification, and calculation of film thickness.

last updated Mar 13, 2025

Angle-resolved HAXPES measurement

HAXPES: Hard X-ray Photoelectron Spectroscopy

last updated Mar 12, 2025

[Analysis Case] Qualitative Evaluation of Fiber Optic Core and Cladding

Qualitative and distribution evaluation of optical fiber materials is possible using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Water Repellent Areas

TOF-SIMS enables wide-area imaging evaluation of multiple components.

last updated Mar 13, 2025

Case studies related to EV (Electric Vehicle) analysis

Analyze the EVolution of EV development!

last updated Jun 06, 2024

[Case Study] Quality Control through Surface Analysis

The surface adhesion components (such as polydimethylsiloxane) can be evaluated using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Heating SSRM Evaluation of Multilayer Ceramic Capacitors (MLCC)

Visualization of conduction paths (insulation degradation areas) within the dielectric.

last updated Mar 13, 2025

Total light transmittance measurement, total light reflectance measurement

By using an integrating sphere, it is possible to measure samples with surface roughness or thickness.

last updated Mar 12, 2025

[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

Insights into the carrier lifetime of SiC can be obtained from the luminous lifetime.

last updated Mar 13, 2025

[Analysis Case] Solder Wetting Test for Semiconductor Packages

It is possible to conduct solder wetting tests on electrodes after accelerated degradation testing.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Fluoride Ion Concentration in Lithium-Ion Battery Electrolyte

Quantitative analysis of fluoride ions can be performed using NMR.

last updated Mar 13, 2025

[Analysis Case] Surface Shape Analysis of GaN Substrates

Visualization of step-terrace structures by AFM.

last updated Mar 13, 2025

List of reliability tests

Reliability Test

last updated Mar 12, 2025

Evaluation avoiding duplication of Oji Peak by HAXPES.

Comparison of spectra obtained from Ga line (HAXPES) and Al line/Mg line (XPS) measurements.

last updated Mar 12, 2025

[Analysis Case] Evaluation of the Imidization Reaction of Polyimide

The degree of imidization due to differences in heating conditions can be evaluated using XPS.

last updated Mar 13, 2025

[Analysis Case] Composition Analysis of UV Curing Resin

The identification capability is enhanced when combined with soft ionization methods.

last updated Mar 13, 2025

[Analysis Case] Qualitative and Structural Analysis of Resin (Synthetic Polymer)

Insights into molecular structure can be obtained through combined analysis using FT-IR and thermal decomposition GC/MS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Curing Degree of UV-Cured Resin by FT-IR

By capturing changes in functional groups, it is possible to evaluate the curing degree of UV-curable resins.

last updated Mar 13, 2025

[Analysis Case] Binding State Mapping by XPS

It is possible to evaluate the distribution of surface contamination and surface treatment on samples with mm-order precision.

last updated Mar 13, 2025

[Analysis Case] Wide-area Quantitative Mapping using XPS

It is possible to evaluate the composition distribution in an area of up to 70×70mm.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Sn Surface State by XPS

It is possible to calculate the ratio by valence (divalent, tetravalent).

last updated Mar 13, 2025

[Analysis Case] Impurity Evaluation of MLCC Using Diagonal Processing MLCC

Evaluation of impurity distribution in ceramic layers using diagonal processing.

last updated Mar 13, 2025

[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

Simultaneous measurement of inorganic and organic components in minute specific areas.

last updated May 19, 2025

[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

last updated Jul 18, 2025