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[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

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[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

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Insights into the carrier lifetime of SiC can be obtained from the luminous lifetime.

Carrier lifetime refers to the time it takes for minority carriers among the excess carriers generated during the operation of electronic devices to decay to 1/e. Proper control of this is important for managing the electrical characteristics of the device. On the other hand, luminescence lifetime indicates the time until the luminescence intensity from the sample reaches 1/e, and it can be calculated from the luminescence decay curve. Since some minority carriers emit light during recombination, it is possible to indirectly evaluate the carrier lifetime from luminescence lifetime measurements. This document presents a case study on the evaluation of carrier lifetime for 4H-SiC epitaxial substrates. Measurement method: Fluorescence lifetime measurement Product fields: Power devices, LSI/memory, electronic components Analysis purposes: Failure analysis, defect analysis, product investigation, carrier lifetime, process evaluation For more details, please download the document or contact us.

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Analysis of power devices, LSI/memory, and electronic components.

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[Analysis Case] Carrier Lifetime Evaluation by Photoluminescence Lifetime Measurement_C0696

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