[Analysis Case] Evaluation of Impurities in Metal Wires

Visualizing the in-plane distribution of impurities such as atmospheric components with a field equivalent to SEM.

last updated Mar 13, 2025

[Analysis Case] Photoluminescence Mapping Measurement of SiC Diodes

Detection cases of stacking faults in SiC.

last updated Mar 13, 2025

[Analysis Case] Evaluation of SUS Passive Film Depth Direction State and Oxide Film Thickness

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Distribution and State Evaluation of OH on Aluminum (Al) Surface

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Silicon (Si) Oxide Film State

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Electrode Materials for Lithium-Ion Secondary Batteries

Cross-sectional observation using atmosphere-controlled ion polishing (IP) processing is possible.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Lithium-Ion Secondary Battery Separators

Cool the sample and evaluate the shape of the separator more accurately.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Si Anode in Lithium-Ion Secondary Batteries

It is possible to evaluate the structure of the Si anode after charging through sample cooling.

last updated Mar 13, 2025

[Analysis Case] Composition Analysis of Sheet-Like Active Material for Lithium-Ion Secondary Batteries

Quantitative analysis of the main components of sheet-like active substances is possible.

last updated Mar 13, 2025

[Analysis Case] Layered Structure Analysis of Heat-Resistant PET Bottles for Food Use

It is possible to identify the components of each layer of PET bottles using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] SiC by SIMS

Imaging SIMS allows for the evaluation of localized elements.

last updated Mar 13, 2025

[Analysis Case] Evaluation of SiC Power MOSFET Dopants by SIMS

Imaging SIMS enables the evaluation of localized elements.

last updated Mar 13, 2025

[Analysis Case] Depth Profile Analysis of Dopant Elements in SiC Using SIMS

It is possible to evaluate the depth distribution of B, Al, N, P, and As in SiC with high sensitivity.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Cleansing Oil's Cleaning Effectiveness

Measurement examples of cleaning residues using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Surface Metal Contamination in Plastic Containers

Evaluation of the composition and distribution of impurities in polymer materials using XRF.

last updated Mar 13, 2025

[Analysis Case] Photoluminescence Analysis of White LEDs

Verification of the luminous characteristics of the chip and phosphor in white LEDs.

last updated Mar 13, 2025

[Analysis Case] SCM Analysis of SiC Planer Power MOS

You can visualize the diffusion layer structure of SiC devices.

last updated Mar 13, 2025

[Analysis Case] Composition and Impurity Analysis of CIGS Powder

Quantitative analysis of main components and trace components is possible.

last updated Mar 13, 2025

Analysis case: Composition distribution analysis of CIGS thin films

It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.

last updated Mar 13, 2025

[Analysis Case] Qualitative Analysis of Epoxy Resin

Estimation of components is possible through TOF-SIMS analysis.

last updated Mar 13, 2025

[Analysis Case] Cross-sectional Observation and Elemental Analysis of Soft Materials

Direct evaluation of the structure of solution samples through cryo-SEM observation and EDX analysis.

last updated Sep 08, 2025

[Analysis Case] Evaluation of Crystal Structure by Micro XRD Analysis

XRD measurements in micro areas are possible.

last updated Mar 13, 2025

Analysis Case: Evaluation of Crystallinity in Polymer Materials

It is possible to evaluate the change in crystallinity while increasing the temperature.

last updated Mar 13, 2025

[Analysis Case] Identification of Pyrolysis Products by High-Temperature XRD

XRD measurement can be performed while increasing the temperature.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Film-Forming Component Encroachment on the Back Surface of the Wafer

Quantitative evaluation of metal components is possible near the bevel area.

last updated Mar 13, 2025

[Analysis Case] Quantification of Interstitial Atom Concentration in Silicon Single Crystals

Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.

last updated Mar 13, 2025

[Analysis Case] Investigation of the Causes of Wettability Changes Due to Plasma Treatment

Evaluation of the top surface of modified layers of polymers, resins, and films using TOF-SIMS is possible.

last updated Mar 13, 2025

[Analysis Case] Depth Direction Analysis of Polyimide Components

Evaluation of the depth direction of surface modification layers of polymers, resins, and films using TOF-SIMS is possible.

last updated Mar 13, 2025

[Analysis Case] Depth Direction Analysis of Degradation Components in GCIB_Ar Cluster Organic Materials

Component evaluation of organic EL layer structures and degradation layers using GCIB under controlled atmosphere.

last updated Mar 13, 2025

[Analysis Case] Distribution Evaluation of Chitosan by TOF-SIMS

Visualization of pharmaceutical components using TOF-SIMS.

last updated Mar 13, 2025