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661~690 item / All 787 items
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[Analysis Case] Vapor Pressure Calculation of Ga-containing Precursor by Molecular Dynamics Simulation
Effective for predicting the vapor pressure of metal complexes used as precursors in ALD and CVD!
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[Analysis Case] Internal Structure Evaluation of Battery Components Using Nano-CT
Observe the fine structure inside the sample in three dimensions with a spatial resolution of 100 nm!
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[Analysis Case] Investigation of Foreign Object Occurrence: Analysis of the Tube
It is possible to estimate the cause of wafer contamination!
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[Analysis Case] Contamination Analysis in Vacuum Equipment
It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!
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[Analysis Case] Evaluation of Surface Components of Fur
It is possible to quantify the surface condition through surface analysis of animal fur (coat)!
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[Analysis Case] Competitive Adsorption Analysis of SMI and TMA on Cu_C0743
It is possible to evaluate the competitive adsorption of multiple molecules using the focus parameters for film formation (temperature, pressure).
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[Analysis Case] Evaluation of Ion Diffusion Behavior through Molecular Dynamics Calculations
It is possible to predict and evaluate the diffusion behavior of ions by changing the composition and temperature.
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[Analysis Case] Evaluation of Solution Components Before and After Adsorption and Zeolite Structure
We capture the ion exchange process from the ion content in the solution and the structural changes of the adsorbent.
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[Analysis Case] Non-destructive Analysis of All-Solid-State Batteries Using X-ray CT
X-ray CT allows us to observe structural changes before and after charging and discharging.
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[Analysis Case] Evaluation of CNF Fiber Orientation Using Nano-CT
Three-dimensional observation of fibers on the nanometer order inside the sample is possible.
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SIMS (Secondary Ion Mass Spectrometry)
This is a method for qualitative and quantitative analysis of components contained in a sample by detecting secondary ions and measuring the detection amount at each mass.
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(S)TEM (Scanning Transmission Electron Microscopy)
Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.
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[XPS] X-ray Photoelectron Spectroscopy
Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).
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Scanning Electron Microscopy (SEM)
High magnification observation (up to about 300,000 times) is possible.
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[AES] Auger Electron Spectroscopy
By measuring the kinetic energy distribution of Auger electrons emitted by electron beam irradiation, insights can be gained regarding the types and quantities of elements present on the sample surface.
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X-ray diffraction method
XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.
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[EBSD] Electron Backscatter Diffraction Method
It is possible to easily obtain crystal information over a wide area.
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[LC/MS] Liquid Chromatography Mass Spectrometry
It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.
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Atomic Force Microscopy (AFM) method
Three-dimensional measurement of nanoscale surface roughness.
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Fourier Transform Infrared Spectroscopy (FT-IR)
Measurement of areas on the order of several tens of micrometers is possible.
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Raman spectroscopy
Obtain information about the molecular structure and crystal structure of the sample.
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[EMS] Emission Microscopy Method
Rapid identification of the malfunctioning area.
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[TEM-EDX] Energy Dispersive X-ray Spectroscopy
It is an analytical method for qualitative and quantitative analysis of organic compounds.
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X-ray Reflectivity Method
XRR:X-ray Reflectivity
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[TOF-SIMS] Time-of-Flight Secondary Ion Mass Spectrometry
This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the very surface.
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[UPS] Ultraviolet Photoelectron Spectroscopy
For qualitative and quantitative analysis of the composition of the sample surface and work function evaluation.
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[SAXS] Small-Angle X-ray Scattering Method
- Capable of evaluating periodic structures and orientation at the nanoscale.
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[SCM][SNDM]
Visualizing career distribution in two dimensions
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White light interferometry
Non-contact and non-destructive 3D measurement is possible.
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Analysis Visit Seminar
We will hold a seminar on analysis free of charge!
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