[Slice&View] Three-Dimensional SEM Observation Method

By repeatedly performing cross-sectioning processing with FIB and observation with SEM, and reconstructing the obtained images, three-dimensional structural information can be obtained.

last updated Mar 12, 2025

X-ray Absorption Fine Structure (XAFS)

XAFS is a method for analyzing the absorption spectrum obtained by irradiating a substance with X-rays.

last updated Mar 12, 2025

[GDMS] Glow Discharge Mass Spectrometry

Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.

last updated Mar 12, 2025

Ion Chromatography Method

Ion chromatography is a method for detecting ionic components in liquid samples.

last updated Mar 12, 2025

Strong support for research and development: "Contract Analysis Services"

We will conduct contract analysis of materials and products entrusted to us by our customers. We will handle everything from pre-treatment to measurement and provide analysis data.

last updated Mar 17, 2025

[Analysis Case] IGZO

Case studies of XRD and XRR analysis of oxide semiconductors.

last updated Mar 13, 2025

New TOF-SIMS analysis service launched, ideal for organic EL analysis.

It has become possible to analyze in depth without damaging organic components! The spatial resolution has also improved compared to conventional methods, allowing for evaluation in narrow areas.

last updated May 28, 2024

[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements

Evaluation of organic EL layer structures and degradation layers using GCIB (Ar cluster) under atmospheric control.

last updated Oct 03, 2025

Cryo-SEM analysis: Evaluation of the dispersion state of microparticles in liquid.

By rapid freezing and SEM observation, the dispersion of particles was confirmed through images! ★Data displayed at the 25th Interphex Japan★

last updated May 28, 2024

SIMS (Secondary Ion Mass Spectrometry)

This is a method for qualitative and quantitative analysis of components contained in a sample by detecting secondary ions and measuring the detection amount at each mass.

last updated Mar 12, 2025

(S)TEM (Scanning Transmission Electron Microscopy)

Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.

last updated Mar 12, 2025

[XPS] X-ray Photoelectron Spectroscopy

Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).

last updated Mar 12, 2025

Scanning Electron Microscopy (SEM)

High magnification observation (up to about 300,000 times) is possible.

last updated Mar 12, 2025

[AES] Auger Electron Spectroscopy

By measuring the kinetic energy distribution of Auger electrons emitted by electron beam irradiation, insights can be gained regarding the types and quantities of elements present on the sample surface.

last updated Mar 12, 2025

X-ray diffraction method

XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.

last updated Mar 12, 2025

[EBSD] Electron Backscatter Diffraction Method

It is possible to easily obtain crystal information over a wide area.

last updated Mar 12, 2025

[LC/MS] Liquid Chromatography Mass Spectrometry

It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.

last updated Mar 12, 2025

Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

last updated Mar 12, 2025

Fourier Transform Infrared Spectroscopy (FT-IR)

Measurement of areas on the order of several tens of micrometers is possible.

last updated Mar 12, 2025

Raman spectroscopy

Obtain information about the molecular structure and crystal structure of the sample.

last updated Mar 12, 2025

[EMS] Emission Microscopy Method

Rapid identification of the malfunctioning area.

last updated Mar 12, 2025

[TEM-EDX] Energy Dispersive X-ray Spectroscopy

It is an analytical method for qualitative and quantitative analysis of organic compounds.

last updated Mar 12, 2025

X-ray Reflectivity Method

XRR：X-ray Reflectivity

last updated Mar 12, 2025

[TOF-SIMS] Time-of-Flight Secondary Ion Mass Spectrometry

This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the very surface.

last updated Mar 12, 2025

[UPS] Ultraviolet Photoelectron Spectroscopy

For qualitative and quantitative analysis of the composition of the sample surface and work function evaluation.

last updated Mar 12, 2025

[SAXS] Small-Angle X-ray Scattering Method

- Capable of evaluating periodic structures and orientation at the nanoscale.

last updated Mar 12, 2025

［SCM］［SNDM］

Visualizing career distribution in two dimensions

last updated Mar 12, 2025

White light interferometry

Non-contact and non-destructive 3D measurement is possible.

last updated Mar 12, 2025

Analysis Visit Seminar

We will hold a seminar on analysis free of charge!

last updated Mar 14, 2025

Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

This is a method for inorganic element analysis using inductively coupled plasma (ICP) as the excitation source.

last updated Mar 12, 2025