[TEM-EDX] Energy Dispersive X-ray Spectroscopy

It is an analytical method for qualitative and quantitative analysis of organic compounds.

last updated Mar 12, 2025

X-ray Reflectivity Method

XRR：X-ray Reflectivity

last updated Mar 12, 2025

[TOF-SIMS] Time-of-Flight Secondary Ion Mass Spectrometry

This is a method for structural analysis of the sample surface. Due to its sensitivity to the surface compared to other analytical devices, it is suitable for identifying organic contaminants on the very surface.

last updated Mar 12, 2025

[UPS] Ultraviolet Photoelectron Spectroscopy

For qualitative and quantitative analysis of the composition of the sample surface and work function evaluation.

last updated Mar 12, 2025

[SAXS] Small-Angle X-ray Scattering Method

- Capable of evaluating periodic structures and orientation at the nanoscale.

last updated Mar 12, 2025

［SCM］［SNDM］

Visualizing career distribution in two dimensions

last updated Mar 12, 2025

White light interferometry

Non-contact and non-destructive 3D measurement is possible.

last updated Mar 12, 2025

Analysis Visit Seminar

We will hold a seminar on analysis free of charge!

last updated Mar 14, 2025

Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

This is a method for inorganic element analysis using inductively coupled plasma (ICP) as the excitation source.

last updated Mar 12, 2025

Differential Thermal Balance - Mass Spectrometry Method

Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.

last updated Mar 13, 2025

[EBIC] Electron Beam Induced Current

A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).

last updated Mar 12, 2025

[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM)

It is a method for conducting elemental analysis and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy.

last updated Mar 12, 2025

[TEM-EELS] Electron Energy Loss Spectroscopy

By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.

last updated Mar 12, 2025

[SIM] Scanning Ion Microscopy Method

Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).

last updated Mar 12, 2025

[SSRM] Scanning Spreading Resistance Microscopy

Local resistance measurement at the nanometer level is possible.

last updated Mar 12, 2025

[FIB] Focused Ion Beam Processing

FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.

last updated Mar 12, 2025

[IP Method] Ar Ion Polishing Processing

The IP method is a type of polishing technique that uses ion beams for processing.

last updated Mar 12, 2025

Treatment under non-atmospheric exposure

It is possible to evaluate the sample in its original state.

last updated Mar 12, 2025

Cryo processing

Cooling and hardening the soft sample to make it machinable.

last updated Mar 12, 2025

[Analysis Case] Evaluation of the Diffusion Layer Distribution of a Transistor (MOSFET)

Evaluation of diffusion layers in specific areas using SCM.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells

Resistance distribution and evaluation of crystal grains and grain boundaries at the same location.

last updated Mar 13, 2025

[Analysis Case] Observation of the Buffer Layer Interface in CIGS Thin-Film Solar Cells

Crystal structure evaluation of the Zn(S, O, OH)/CIGS junction interface using ultra-high resolution STEM.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.

last updated Mar 13, 2025

[Analysis Case] Degradation Assessment After Charge and Discharge Cycle Testing of LIB

From the production of battery cells to charge and discharge cycle testing, disassembly, and investigation of degradation components.

last updated Jul 24, 2025

[Analysis Case] Evaluation of Degradation of Lithium-Ion Secondary Battery Anodes

Consistent evaluation from battery cell manufacturing, degradation testing, disassembly, to investigation of state changes due to degradation.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Main Components of Lithium-ion Secondary Battery Electrolyte

We will dismantle and analyze regardless of the experimental cell.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Depth Distribution of Alkali Metals in SiO2 Using SIMS

High-precision distribution evaluation of alkali metals through sample cooling.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Depth Distribution of B near the Si Surface using SIMS

High-precision B profile analysis through sample cooling.

last updated Mar 13, 2025

[Analysis Case] Structural Evaluation of Carbon Films

Evaluation of structural specificity, crystallinity, and sp3 characteristics.

last updated Mar 13, 2025

[Analysis Case] LC/MS Analysis of Ergothioneine

Evaluation of the yield and purification level of amino acids derived from natural sources.

last updated Mar 13, 2025