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631~660 item / All 788 items
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[Analysis Case] Investigation of Curing Temperature and Glass Transition Temperature of Epoxy Resin
Evaluation of thermal properties by DSC (Differential Scanning Calorimetry) measurement.
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Analysis of evolved gases and identification of polymer materials using GC/MS.
Principles and Applications of Pyrolysis GC/MS
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[Analysis Case] Composite Analysis of White Powder
Identification of powders by FT-IR analysis and XRF analysis.
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[Analysis Case] Evaluation of Bone Condition Before and After HF Treatment
Evaluation of the state before and after drug solution treatment using Raman analysis.
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[Analysis Case] Pyrolysis GC/MS Double Shot Method, Identification of Plastics and Additives
Composite analysis using TG-DTA and GC/MS.
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[Analysis Case] Component Identification of Foreign Substances Considering Thermal History
Proposal for the use of standard samples with aligned thermal history.
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[Analysis Case] Investigation of Watermark Causes
Identification of contamination sources on the outermost surface using TOF-SIMS.
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[Analysis Case] Investigation of Causes of Peeling in Plating and Coating
Identification of contamination sources on the cleavage surface using TOF-SIMS.
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SEM analysis under atmosphere control and cooling.
Processing under atmosphere control, cryo-processing, cooling, SEM: scanning electron microscopy and others.
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TEM analysis under atmosphere control and cooling.
Processing under atmosphere control, cryo-processing, cooling, TEM: transmission electron microscopy and others.
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[Analysis Case] Evaluation of Carrier Distribution in Crystalline Si Solar Cells
Evaluation of carrier diffusion layer uniformity in samples with surface roughness.
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[Analysis Case] Impurity Evaluation of Crystalline Si Solar Cells
Trace analysis of metallic elements and atmospheric component elements.
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[Analysis Case] Evaluation of the Diffusion Layer in Crystalline Si Solar Cells
Quantitative evaluation of dopants and evaluation of carrier distribution.
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[Analysis Case] PL Mapping of Multicrystalline Silicon Solar Cells
It is possible to non-destructively identify the location of defects in solar cell cells.
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[Analysis Case] Evaluation of the Structure and Dispersion of Microparticles in Liquid
Observation of cross-sectional structure of liquid samples using cryo-SEM.
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[Analysis Case] Observation of the Cross-Section of Tooth Enamel Prisms
Applying FIB processing technology, the entire interface of enamel/dental adhesive is observed.
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[Analysis Case] Condition Assessment of Highly Degraded Organic Materials
It is possible to accurately evaluate materials through sampling under controlled atmospheric conditions.
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[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards
Reduce the impact of foreign matter surrounding information through appropriate sampling and microscopic measurement.
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Ultramicrotome processing
This is a processing method for cutting bulk samples using a diamond knife to produce ultra-thin sections for transmission electron microscopy with a thickness of less than 100 nm.
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Ar ion milling processing
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low-energy Ar ion beam.
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Total Organic Carbon Measurement
The TOC analyzer is a device that can evaluate the total carbon content, total organic carbon content, and inorganic carbon content (IC) in a sample.
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[RBS] Rutherford Backscattering Spectrometry
It is a method for measuring the energy and intensity of ions scattered backward by Rutherford scattering after irradiating a solid sample with an ion beam.
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[XRF] X-ray fluorescence analysis method
This is a method for conducting elemental analysis and compositional analysis by detecting fluorescent X-rays generated by irradiating with X-rays and spectrally analyzing them using energy or a spectroscopic crystal.
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Differential Scanning Calorimetry (DSC)
DSC can evaluate the physical properties of a sample based on the heat changes that occur during heating.
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Lock-in thermal analysis method
The lock-in thermal analysis method detects slight temperature increases in the current path.
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[OBIRCH] Light Beam Heating Resistance Variation Method
OBIRCH is a method that utilizes the change in resistance caused by the heat generated at defect locations when light is applied, to identify abnormal areas.
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[SRA] Spread Resistance Measurement Method
SRA:Spreading Resistance Analysis
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[SMM] Scanning Microwave Microscopy Method
Scanning Microwave Microscopy
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[ED] Electron Diffraction Method
ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.
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[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)
EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional analysis.
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