[Analysis Case] Evaluation of Carrier Distribution in Crystalline Si Solar Cells
Evaluation of carrier diffusion layer uniformity in samples with surface roughness.
This is an introduction to a case where the carrier diffusion layer distribution of the surface textured part and the back surface field (BSF) part of BSF-type crystalline silicon solar cells was evaluated using SCM. In the textured part, the pn junction is formed along the surface irregularities, while in the BSF part, it can be confirmed that the carrier distribution is interrupted and uneven.
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Applications/Examples of results
Measurement methods: SEM, SCM, polishing, etching, disassembly Product field: Solar cells Analysis purpose: Shape evaluation, product investigation