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Ar ion milling processing

This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low-energy Ar ion beam.

The Ar ion milling method is a processing technique used to create thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low-energy Ar ion beam.

Related Link - https://www.mst.or.jp/method/tabid/173/Default.asp…

basic information

1. Bonding The samples are bonded together with adhesive or bonded to the support substrate. 2. Cutting Cut out with a thickness of a few millimeters. 3. Polishing Perform mechanical polishing to thin the material so that the bonding interface is centered. 4. Ar Ion Milling Irradiate with low-energy Ar ions to achieve thinning.

Price information

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Applications/Examples of results

- Thickness evaluation of thin films on substrates (cross-sectional TEM observation) - Evaluation of crystal grains in thin films on substrates (plan-view TEM observation)

Detailed information

Ar Ion Milling Process_B0203

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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!