Ar ion milling processing
This is a processing method for producing thin film samples for transmission electron microscopy with a thickness of less than 50 nm by performing mechanical polishing followed by finishing with a low-energy Ar ion beam.
basic information
1. Bonding The samples are bonded together with adhesive or bonded to the support substrate. 2. Cutting Cut out with a thickness of a few millimeters. 3. Polishing Perform mechanical polishing to thin the material so that the bonding interface is centered. 4. Ar Ion Milling Irradiate with low-energy Ar ions to achieve thinning.
Price information
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Delivery Time
Applications/Examples of results
- Thickness evaluation of thin films on substrates (cross-sectional TEM observation) - Evaluation of crystal grains in thin films on substrates (plan-view TEM observation)
Detailed information
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Please consult with us first. ★ We will start by proposing an analysis plan ★ Meeting at your company is, of course, possible. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!
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We will hold a visiting seminar. ★ We offer free seminars with engineers tailored to our customers' needs ★ Depending on your requests, we will introduce analytical techniques and explain analytical data. ◆ Example seminar content - A broad explanation of MST's analytical methods - A thorough and detailed explanation of specific analytical methods from the principles - An explanation of the analytical data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!