[XRF] X-ray fluorescence analysis method

This is a method for conducting elemental analysis and compositional analysis by detecting fluorescent X-rays generated by irradiating with X-rays and spectrally analyzing them using energy or a spectroscopic crystal.

last updated Mar 12, 2025

Differential Scanning Calorimetry (DSC)

DSC can evaluate the physical properties of a sample based on the heat changes that occur during heating.

last updated Mar 12, 2025

Lock-in thermal analysis method

The lock-in thermal analysis method detects slight temperature increases in the current path.

last updated Mar 12, 2025

[OBIRCH] Light Beam Heating Resistance Variation Method

OBIRCH is a method that utilizes the change in resistance caused by the heat generated at defect locations when light is applied, to identify abnormal areas.

last updated Mar 12, 2025

[SRA] Spread Resistance Measurement Method

SRA：Spreading Resistance Analysis

last updated Mar 12, 2025

[SMM] Scanning Microwave Microscopy Method

Scanning Microwave Microscopy

last updated Mar 12, 2025

[ED] Electron Diffraction Method

ED is a method for investigating crystal structures from diffraction patterns obtained by irradiating a sample with an electron beam.

last updated Mar 12, 2025

[TEM-EDX] Energy Dispersive X-ray Spectroscopy (TEM)

EDX is a method that measures the energy and occurrence of characteristic X-rays generated when an electron beam is irradiated onto the analysis area, allowing for elemental analysis and compositional analysis.

last updated Mar 12, 2025

[Slice&View] Three-Dimensional SEM Observation Method

By repeatedly performing cross-sectioning processing with FIB and observation with SEM, and reconstructing the obtained images, three-dimensional structural information can be obtained.

last updated Mar 12, 2025

X-ray Absorption Fine Structure (XAFS)

XAFS is a method for analyzing the absorption spectrum obtained by irradiating a substance with X-rays.

last updated Mar 12, 2025

[GDMS] Glow Discharge Mass Spectrometry

Dissociate and fragment specific mass ions, and detect them with a mass spectrometer.

last updated Mar 12, 2025

Ion Chromatography Method

Ion chromatography is a method for detecting ionic components in liquid samples.

last updated Mar 12, 2025

Collection of Various Evaluation Cases for PV (Photovoltaic) Solar Cells

This is a collection of case studies on the composition evaluation, identification, film thickness evaluation, shape evaluation, and crystal structure evaluation of solar cells (PV). The content was also exhibited at the International Solar Cell Exhibition.

last updated May 28, 2024

Strong support for research and development: "Contract Analysis Services"

We will conduct contract analysis of materials and products entrusted to us by our customers. We will handle everything from pre-treatment to measurement and provide analysis data.

last updated Mar 17, 2025

[Analysis Case] IGZO

Case studies of XRD and XRR analysis of oxide semiconductors.

last updated Mar 13, 2025

New TOF-SIMS analysis service launched, ideal for organic EL analysis.

It has become possible to analyze in depth without damaging organic components! The spatial resolution has also improved compared to conventional methods, allowing for evaluation in narrow areas.

last updated May 28, 2024

[Analysis Case] Depth Direction Analysis of Organic EL Material TOF-SIMS RGB Elements

Evaluation of organic EL layer structures and degradation layers using GCIB (Ar cluster) under atmospheric control.

last updated Mar 13, 2025

Cryo-SEM analysis: Evaluation of the dispersion state of microparticles in liquid.

By rapid freezing and SEM observation, the dispersion of particles was confirmed through images! ★Data displayed at the 25th Interphex Japan★

last updated May 28, 2024

SIMS (Secondary Ion Mass Spectrometry)

This is a method for qualitative and quantitative analysis of components contained in a sample by detecting secondary ions and measuring the detection amount at each mass.

last updated Mar 12, 2025

(S)TEM (Scanning Transmission Electron Microscopy)

Elemental analysis, state evaluation, particle size analysis, and acquisition of three-dimensional structural images at the nanoscale.

last updated Mar 12, 2025

[XPS] X-ray Photoelectron Spectroscopy

Effective for evaluating the types, quantities, and chemical bonding states of elements on the sample surface (at a depth of about several nanometers).

last updated Mar 12, 2025

Scanning Electron Microscopy (SEM)

High magnification observation (up to about 300,000 times) is possible.

last updated Mar 12, 2025

[AES] Auger Electron Spectroscopy

By measuring the kinetic energy distribution of Auger electrons emitted by electron beam irradiation, insights can be gained regarding the types and quantities of elements present on the sample surface.

last updated Mar 12, 2025

X-ray diffraction method

XRD is a method for obtaining information about the crystal structure of a sample from its diffraction pattern.

last updated Mar 12, 2025

[EBSD] Electron Backscatter Diffraction Method

It is possible to easily obtain crystal information over a wide area.

last updated Mar 12, 2025

[LC/MS] Liquid Chromatography Mass Spectrometry

It is an analytical method that detects ions with a detector and performs qualitative and quantitative analysis.

last updated Mar 12, 2025

Atomic Force Microscopy (AFM) method

Three-dimensional measurement of nanoscale surface roughness.

last updated Mar 12, 2025

Fourier Transform Infrared Spectroscopy (FT-IR)

Measurement of areas on the order of several tens of micrometers is possible.

last updated Mar 12, 2025

Raman spectroscopy

Obtain information about the molecular structure and crystal structure of the sample.

last updated Mar 12, 2025

[EMS] Emission Microscopy Method

Rapid identification of the malfunctioning area.

last updated Mar 12, 2025