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[Analysis Case] Evaluation of Crystal Structure by Micro XRD Analysis

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[Analysis Case] Evaluation of Crystal Structure by Micro XRD Analysis

C0246.jpg
C0246.jpg DSC_1360.jpg みなとみらい２１線馬車道駅改札.JPG ホール画像.jpg IMG00000073can1.jpg 1479455724326.jpg 大学図書館4.jpg

XRD measurements in micro areas are possible.

We will introduce a case where XRD measurements were conducted by narrowing the X-ray beam to Φ400μm, allowing us to obtain crystal information targeting a specific area rather than the entire surface. In the XRD measurement results of the printed circuit board sample, Cu and BaSO4 were detected at all measurement points (1) to (3), and a peak from Au was detected at the measurement point (1), which is the electrode. This aligns well with the results from XRF measurements. Thus, it is possible to identify crystal structures by targeting regions of several hundred micrometers with different compositions and crystallinities. Measurement methods: XRD, XRF Product fields: LSI, memory, electronic components Analysis purposes: Composition evaluation, identification, structural evaluation For more details, please download the materials or contact us.

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Analysis of LSI, memory, and electronic components.

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[Analysis Case] Evaluation of Crystal Structure by Micro XRD Analysis_C0246

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