Analysis case: Composition distribution analysis of CIGS thin films
It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.
In the development aimed at enhancing the performance of CIGS thin-film solar cells, the optimization of the film formation process conditions for the light-absorbing layer is necessary, and controlling the compositional distribution of the CIGS composition has become important. This document presents cases where the composition of the deposited CIGS thin film was quantitatively analyzed with high precision using ICP-MS, evaluated for depth concentration distribution using SIMS, and assessed for in-plane concentration distribution on the substrate using XRF. Measurement methods: SIMS, ICP-MS, XRF, etching Product field: Solar cells Analysis objectives: Composition evaluation, identification, compositional distribution assessment, film thickness evaluation, product investigation For more details, please download the materials or contact us.
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Applications/Examples of results
Analysis of solar cells.