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[XRF] X-ray fluorescence analysis method

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[XRF] X-ray fluorescence analysis method

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This is a method for conducting elemental analysis and compositional analysis by detecting fluorescent X-rays generated by irradiating with X-rays and spectrally analyzing them using energy or a spectroscopic crystal.

X-ray fluorescence analysis (XRF) is a method that detects fluorescent X-rays generated by irradiated X-rays and performs elemental and compositional analysis by spectrally analyzing the energy and using a spectroscopic crystal. - The entire energy measurement range (from Na to U) can be measured simultaneously in a short time. - Suitable for the analysis of unknown samples. - Non-destructive analysis. - No pre-treatment is required except for special samples, allowing for easy analysis in the atmosphere. - Elemental analysis of large samples that cannot be moved is possible with a handheld device.

Related Link - https://www.mst.or.jp/method/tabid/168/Default.asp…

basic information

XRF detects fluorescent X-rays generated by X-ray irradiation by spectrally analyzing them using energy or spectroscopic crystals. The energy of the fluorescent X-rays is characteristic of the elements, allowing for the identification of the elements that make up the sample. Additionally, information about the composition can be obtained from the intensity.

Price information

The price varies depending on the measurement target, so please feel free to contact us.

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Applications/Examples of results

- Evaluation of the composition of metallic materials - Visualization of elemental distribution in ceramics - Elemental analysis of foreign substances in resin - Acquisition of transmission X-ray images - Measurement of plating film thickness on components - Evaluation of film thickness distribution of metal films on wafers - Identification of residue components - Elemental analysis of liquids - Investigation of model numbers for SUS materials

Detailed information

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