Inductively Coupled Plasma Mass Spectrometry (ICP-MS)

This is a method for inorganic element analysis using inductively coupled plasma (ICP) as the excitation source.

最終更新日 Mar 12, 2025

Differential Thermal Balance - Mass Spectrometry Method

Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.

最終更新日 Mar 13, 2025

[EBIC] Electron Beam Induced Current

A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).

最終更新日 Mar 12, 2025

[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM)

It is a method for conducting elemental analysis and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy.

最終更新日 Mar 12, 2025

[TEM-EELS] Electron Energy Loss Spectroscopy

By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.

最終更新日 Mar 12, 2025

[SIM] Scanning Ion Microscopy Method

Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).

最終更新日 Sep 17, 2025

[SSRM] Scanning Spreading Resistance Microscopy

Local resistance measurement at the nanometer level is possible.

最終更新日 Mar 12, 2025

[FIB] Focused Ion Beam Processing

FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.

最終更新日 Mar 12, 2025

[IP Method] Ar Ion Polishing Processing

The IP method is a type of polishing technique that uses ion beams for processing.

最終更新日 Mar 12, 2025

Treatment under non-atmospheric exposure

It is possible to evaluate the sample in its original state.

最終更新日 Mar 12, 2025

Cryo processing

Cooling and hardening the soft sample to make it machinable.

最終更新日 Mar 12, 2025

[Analysis Case] Evaluation of the Diffusion Layer Distribution of a Transistor (MOSFET)

Evaluation of diffusion layers in specific areas using SCM.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells

Resistance distribution and evaluation of crystal grains and grain boundaries at the same location.

最終更新日 Mar 13, 2025

[Analysis Case] Observation of the Buffer Layer Interface in CIGS Thin-Film Solar Cells

Crystal structure evaluation of the Zn(S, O, OH)/CIGS junction interface using ultra-high resolution STEM.

最終更新日 Sep 17, 2025

[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.

It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.

最終更新日 Sep 18, 2025

[Analysis Case] Degradation Assessment After Charge and Discharge Cycle Testing of LIB

From the production of battery cells to charge and discharge cycle testing, disassembly, and investigation of degradation components.

最終更新日 Jul 24, 2025

[Analysis Case] Evaluation of Degradation of Lithium-Ion Secondary Battery Anodes

Consistent evaluation from battery cell manufacturing, degradation testing, disassembly, to investigation of state changes due to degradation.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Main Components of Lithium-ion Secondary Battery Electrolyte

We will dismantle and analyze regardless of the experimental cell.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Depth Distribution of Alkali Metals in SiO2 Using SIMS

High-precision distribution evaluation of alkali metals through sample cooling.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of the Depth Distribution of B near the Si Surface using SIMS

High-precision B profile analysis through sample cooling.

最終更新日 Mar 13, 2025

[Analysis Case] Structural Evaluation of Carbon Films

Evaluation of structural specificity, crystallinity, and sp3 characteristics.

最終更新日 Mar 13, 2025

[Analysis Case] LC/MS Analysis of Ergothioneine

Evaluation of the yield and purification level of amino acids derived from natural sources.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Metal Distribution within Hair

Evaluation of component distribution in hair cross-sections using TOF-SIMS analysis.

最終更新日 Oct 03, 2025

[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors

Clearly observable structure of the diffusion layer including pn junction determination.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Flux Cleaning Residue

We capture the minute and ultra-thin residue as an image.

最終更新日 Mar 13, 2025

[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels

We capture foreign substances and dirt from microns to centimeter order as an image.

最終更新日 Mar 13, 2025

[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards

Reduce the impact of foreign object surrounding information with appropriate sampling.

最終更新日 Sep 17, 2025

[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS

Properly sampling and measuring surface contamination even on large parts that cannot be cut.

最終更新日 Mar 13, 2025

[Analysis Case] Identification of Fluorine-based Lubricants and Polymers using TOF-SIMS

Identify the contaminating components and estimate the contamination occurrence process.

最終更新日 Mar 13, 2025

[Analysis Case] Evaluation of Adhesive Tape Residue

We will identify the surface adsorbate components using TOF-SIMS.

最終更新日 Mar 13, 2025