All products and services
691~720 item / All 788 items
-

Differential Thermal Balance - Mass Spectrometry Method
Measurement of weight change, differential thermal analysis, heat quantity, and mass of volatile components resulting from heating the sample.
last updated
-

[EBIC] Electron Beam Induced Current
A method to obtain information about the electric field structure inside the sample (junction structure of semiconductors).
last updated
-

[SEM-EDX] Energy Dispersive X-ray Spectroscopy (SEM)
It is a method for conducting elemental analysis and compositional analysis by detecting characteristic X-rays generated by electron beam irradiation and spectrally analyzing them by energy.
last updated
-

[TEM-EELS] Electron Energy Loss Spectroscopy
By measuring the energy lost due to interactions with atoms as electrons pass through thin film samples, the constituent elements and electronic structure of the material can be analyzed.
last updated
-

[SIM] Scanning Ion Microscopy Method
Observation of SIM images is possible with high resolution (accelerating voltage 30kV: 4nm).
last updated
-

[SSRM] Scanning Spreading Resistance Microscopy
Local resistance measurement at the nanometer level is possible.
last updated
-

[FIB] Focused Ion Beam Processing
FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.
last updated
-

[IP Method] Ar Ion Polishing Processing
The IP method is a type of polishing technique that uses ion beams for processing.
last updated
-

Treatment under non-atmospheric exposure
It is possible to evaluate the sample in its original state.
last updated
-

Cryo processing
Cooling and hardening the soft sample to make it machinable.
last updated
-

[Analysis Case] Evaluation of the Diffusion Layer Distribution of a Transistor (MOSFET)
Evaluation of diffusion layers in specific areas using SCM.
last updated
-

[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells
Resistance distribution and evaluation of crystal grains and grain boundaries at the same location.
last updated
-

[Analysis Case] Observation of the Buffer Layer Interface in CIGS Thin-Film Solar Cells
Crystal structure evaluation of the Zn(S, O, OH)/CIGS junction interface using ultra-high resolution STEM.
last updated
-

[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.
It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.
last updated
-

[Analysis Case] Degradation Assessment After Charge and Discharge Cycle Testing of LIB
From the production of battery cells to charge and discharge cycle testing, disassembly, and investigation of degradation components.
last updated
-

[Analysis Case] Evaluation of Degradation of Lithium-Ion Secondary Battery Anodes
Consistent evaluation from battery cell manufacturing, degradation testing, disassembly, to investigation of state changes due to degradation.
last updated
-

[Analysis Case] Evaluation of Main Components of Lithium-ion Secondary Battery Electrolyte
We will dismantle and analyze regardless of the experimental cell.
last updated
-

[Analysis Case] Evaluation of Depth Distribution of Alkali Metals in SiO2 Using SIMS
High-precision distribution evaluation of alkali metals through sample cooling.
last updated
-

[Analysis Case] Evaluation of the Depth Distribution of B near the Si Surface using SIMS
High-precision B profile analysis through sample cooling.
last updated
-

[Analysis Case] Structural Evaluation of Carbon Films
Evaluation of structural specificity, crystallinity, and sp3 characteristics.
last updated
-

[Analysis Case] LC/MS Analysis of Ergothioneine
Evaluation of the yield and purification level of amino acids derived from natural sources.
last updated
-

[Analysis Case] Evaluation of Metal Distribution within Hair
Evaluation of component distribution in hair cross-sections using TOF-SIMS analysis.
last updated
-

[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors
Clearly observable structure of the diffusion layer including pn junction determination.
last updated
-

[Analysis Case] Evaluation of Flux Cleaning Residue
We capture the minute and ultra-thin residue as an image.
last updated
-

[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels
We capture foreign substances and dirt from microns to centimeter order as an image.
last updated
-

[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards
Reduce the impact of foreign object surrounding information with appropriate sampling.
last updated
-

[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS
Properly sampling and measuring surface contamination even on large parts that cannot be cut.
last updated
-

[Analysis Case] Identification of Fluorine-based Lubricants and Polymers using TOF-SIMS
Identify the contaminating components and estimate the contamination occurrence process.
last updated
-

[Analysis Case] Evaluation of Adhesive Tape Residue
We will identify the surface adsorbate components using TOF-SIMS.
last updated
-

[Analysis Case] Evaluation of Element Distribution in Oxide ReRAM Operating Area Using SIMS
High-sensitivity evaluation of local elemental distribution in oxide devices using oxygen isotopes.
last updated