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691~720 item / All 781 items
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[SSRM] Scanning Spreading Resistance Microscopy
Local resistance measurement at the nanometer level is possible.
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[FIB] Focused Ion Beam Processing
FIB refers to a focused ion beam with a diameter ranging from a few nanometers to several hundred nanometers, which can be used to scan the sample surface to etch or deposit material in specific areas.
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[IP Method] Ar Ion Polishing Processing
The IP method is a type of polishing technique that uses ion beams for processing.
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Treatment under non-atmospheric exposure
It is possible to evaluate the sample in its original state.
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Cryo processing
Cooling and hardening the soft sample to make it machinable.
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[Analysis Case] Evaluation of the Diffusion Layer Distribution of a Transistor (MOSFET)
Evaluation of diffusion layers in specific areas using SCM.
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[Analysis Case] Evaluation of Crystal Grains and Resistance in CIGS Thin-Film Solar Cells
Resistance distribution and evaluation of crystal grains and grain boundaries at the same location.
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[Analysis Case] Observation of the Buffer Layer Interface in CIGS Thin-Film Solar Cells
Crystal structure evaluation of the Zn(S, O, OH)/CIGS junction interface using ultra-high resolution STEM.
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[Analysis Case] Evaluation of the state of the organic thin film solar cell electrode interface and the dispersion state of the organic film.
It is possible to conduct a comprehensive evaluation analysis that minimizes the influence of the atmosphere.
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[Analysis Case] Degradation Assessment After Charge and Discharge Cycle Testing of LIB
From the production of battery cells to charge and discharge cycle testing, disassembly, and investigation of degradation components.
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[Analysis Case] Evaluation of Degradation of Lithium-Ion Secondary Battery Anodes
Consistent evaluation from battery cell manufacturing, degradation testing, disassembly, to investigation of state changes due to degradation.
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[Analysis Case] Evaluation of Main Components of Lithium-ion Secondary Battery Electrolyte
We will dismantle and analyze regardless of the experimental cell.
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[Analysis Case] Evaluation of Depth Distribution of Alkali Metals in SiO2 Using SIMS
High-precision distribution evaluation of alkali metals through sample cooling.
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[Analysis Case] Evaluation of the Depth Distribution of B near the Si Surface using SIMS
High-precision B profile analysis through sample cooling.
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[Analysis Case] Structural Evaluation of Carbon Films
Evaluation of structural specificity, crystallinity, and sp3 characteristics.
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[Analysis Case] LC/MS Analysis of Ergothioneine
Evaluation of the yield and purification level of amino acids derived from natural sources.
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[Analysis Case] Evaluation of Metal Distribution within Hair
Evaluation of component distribution in hair cross-sections using TOF-SIMS analysis.
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[Analysis Case] Evaluation of the Diffusion Layer Structure of Bipolar Transistors
Clearly observable structure of the diffusion layer including pn junction determination.
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[Analysis Case] Evaluation of Flux Cleaning Residue
We capture the minute and ultra-thin residue as an image.
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[Analysis Case] Identification and Estimation of Foreign Substances and Contaminants in LCD Panels
We capture foreign substances and dirt from microns to centimeter order as an image.
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[Analysis Case] Analysis of Organic Foreign Substances on Printed Circuit Boards
Reduce the impact of foreign object surrounding information with appropriate sampling.
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[Analysis Case] Investigation of the Causes of Surface Stains and Water Repellency on Parts Using TOF-SIMS
Properly sampling and measuring surface contamination even on large parts that cannot be cut.
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[Analysis Case] Identification of Fluorine-based Lubricants and Polymers using TOF-SIMS
Identify the contaminating components and estimate the contamination occurrence process.
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[Analysis Case] Evaluation of Adhesive Tape Residue
We will identify the surface adsorbate components using TOF-SIMS.
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[Analysis Case] Evaluation of Element Distribution in Oxide ReRAM Operating Area Using SIMS
High-sensitivity evaluation of local elemental distribution in oxide devices using oxygen isotopes.
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[Analysis Case] Depth Direction Analysis of TFT Wiring Intersection Using SSDP-SIMS
Analysis using SSDP is also possible for microdomains and glass substrates.
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[Analysis Case] Visualization of Strain at Heterojunction Interfaces in Compounds
Lattice image analysis using the FFTM method
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[Analysis Case] Observation of the Surface Morphology of ZnO Films
Capable of observing large-area surface shapes.
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[Analysis Case] Observation of Crosshatch Pattern Shape
It is possible to visualize small irregularities with high vertical resolution.
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[Analysis Case] Evaluation of the Distribution of High Fatty Acids in Hair
Visualization of the distribution of high-grade fatty acids.
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