[Analysis Case] Resistance Evaluation of Heterojunction Interface in CIGS Solar Cells

Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Lighting Emitting Devices

We will conduct analysis of various materials, including the disassembly of LEDs, phosphors, and LED chips.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Diffusion Layer of Power Transistors (DMOSFET)

You can understand the positional relationship between the gate layer, source layer, and body layer.

last updated Mar 13, 2025

[Analysis Case] Analysis of Catalysts for Fuel Cells

Chemical state analysis using XPS and morphological observation using TEM.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Solid Polymer Electrolyte Membrane for Fuel Cells

Molecular structure evaluation by TOF-SIMS and chemical state evaluation by XPS.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Hair Roots

Visualization of biological components such as cholesterol and fatty acids using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Observation of Pigment and Dye Dispersion

Micron-order imaging measurement using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the BSF Layer in Si-based Solar Cells

Impurity evaluation with in-plane distribution is possible using cross-sectional imaging SIMS.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Organic EL Displays

We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Interface between the Alq3 Layer and the Emission Layer of Organic EL Devices

Degradation assessment by depth profiling using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of pn Junction and Grain Structure of CIGS Film

Electron beam induced current method and crystal orientation analysis using SEM.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

It is possible to achieve high-precision measurements that are not affected by surface irregularities.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Crystal Grains in CIGS Film

Crystal orientation analysis using SEM.

last updated Mar 13, 2025

[Analysis Case] Cross-Section Observation of Organic Thin-Film Solar Cells

Using low acceleration voltage STEM, slight density differences in organic films can be observed.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Lithium-Ion Secondary Battery Materials

We will conduct an evaluation that combines various methods to solve the problem.

last updated Mar 13, 2025

[Analysis Case] High-Sensitivity Analysis of Light Elements in Semiconductor Substrates Using SIMS

SIMS analysis allows for the evaluation of elements such as H, C, N, O, and F down to levels below 1 ppm.

last updated Mar 13, 2025

[Analysis Case] Observation of Crystal Structure of Multicomponent Metallic Nanoparticles by TEM

Ultra-high resolution STEM observation of InGaZnO4 particles

last updated Mar 13, 2025

[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.

last updated Mar 13, 2025

[Analysis Case] Cross-sectional Observation of TEM/SEM Organic EL and Gate Oxide Film

Low-acceleration STEM observation allows for contrast even in low-density membranes.

last updated Mar 13, 2025

[Analysis Case] Wide-Area Cross-Section Observation of Bumps

Wide-area observation of micro-specific locations is possible through cross-section preparation using ion polishing.

last updated Mar 13, 2025

[Analysis Case] Discrimination between Anatase and Rutile Types of Titanium Dioxide

TEM-EELS enables elemental identification and chemical state analysis in micro-regions.

last updated Mar 13, 2025

[Analysis Case] Contamination Assessment of Si Wafer Bevel Area

It is possible to evaluate both metal components and organic components simultaneously.

last updated Mar 13, 2025

[Analysis Case] Measurement of Film Density and Film Thickness of Organic EL Device Stacked Films

X-ray reflectivity measurement (XRR) allows for non-destructive analysis of film thickness and density.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Composition and Impurity Distribution of ZnO Films by SIMS

Visualization of in-plane distribution through imaging SIMS analysis.

last updated Mar 13, 2025

[Analysis Case] Evaluation of SiON Film by SIMS

Evaluation of nitrogen in SiON with a film thickness of approximately 1 nm is possible.

last updated Mar 13, 2025

[Analysis Case] Evaluation of B Penetration Amount from SSDP-SIMS Gate to Substrate

Measurement avoiding the effects of surface irregularities and high concentration layers using SSDP-SIMS.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Organic EL Devices

TOF-SIMS component analysis of slope-polished organic multilayer structure samples.

last updated Mar 13, 2025

[Analysis Case] Distortion Analysis in the Field of Element Separation

NBD: Strain analysis of micro-regions using Nano Beam Diffraction.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Ultra-Shallow Implant Profiles by SIMS

Evaluation of dopant distribution and junctions is possible even in extremely shallow regions.

last updated Mar 13, 2025