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721~750 item / All 781 items
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[Analysis Case] Evaluation of the Distribution of Hair Care Agent Components in Hair 2
Visualizing the differences in penetrating ingredients and their distribution based on the type of hair care products used.
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[Analysis Case] Evaluation of the Distribution of Hair Care Ingredients in Hair 1
Visualizing the penetration state of each component into the hair.
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[Analysis Case] Preprocessing Technology for Specific Areas of Wafers and Chips
We will sample only the target area and produce samples without breaking the wafer.
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[Analysis Case] Breakdown Observation of 600V Rated SiC Diode
Consistent analysis from preprocessing to luminescence location identification.
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[Analysis Case] Component Analysis of Lithium-Ion Secondary Battery Binders
Identification of organic components by pyrolysis GC/MS.
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[Analysis Case] Evaluation of Specific Crystalline Grains in CIGS Thin-Film Solar Cells
Observation of orthogonal cross-sections at locations with characteristics identified in EBIC measurements of arbitrary cross-sections.
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[Analysis Case] Evaluation of the Mixed State of the Active Layer in Organic Thin-Film Solar Cells
Evaluation of the distribution state of organic materials using low-energy STEM observation and EELS measurement.
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[Analysis Case] Three-Dimensional Observation of Lithium-Ion Secondary Battery Electrodes
Observation of filling degree and voids using Slice and View.
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[Analysis Case] Elemental Analysis of Active Materials in Lithium-Ion Secondary Batteries
Dismantling and sampling can be performed in a non-exposed atmospheric environment, allowing for measurements that minimize degradation and alteration.
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[Analysis Case] Evaluation of Degradation of Lithium-Ion Battery Anode Surface
Measurements and observations will be conducted from pre-treatment to measurement without atmospheric exposure.
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[Analysis Case] Three-Dimensional Distribution Evaluation of Dopants in MEMS Using SIMS
Imaging SIMS allows for the visualization of concentration distributions of trace elements in micro-regions.
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[Analysis Case] Evaluation of Layer Structure of Organic EL Devices
By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.
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What is a HAADF-STEM image?
HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy
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[Analysis Case] Investigation of Defective Bipolar Transistors (IGBT)
Identification of failure locations using an emission microscope with a high voltage power supply.
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[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS
Evaluate organic EL elements with good depth direction resolution.
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[Analysis Case] Observation of Heterojunction Interface in CIGS Thin-Film Solar Cells
Evaluation of the crystal structure of the high-resistance layer at the CdS/CIGS junction interface using ultra-high-resolution STEM.
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[Analysis Case] Resistance Evaluation of Heterojunction Interface in CIGS Solar Cells
Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.
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[Analysis Case] Comprehensive Evaluation of Lighting Emitting Devices
We will conduct analysis of various materials, including the disassembly of LEDs, phosphors, and LED chips.
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[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells
Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.
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[Analysis Case] Evaluation of the Diffusion Layer of Power Transistors (DMOSFET)
You can understand the positional relationship between the gate layer, source layer, and body layer.
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[Analysis Case] Evaluation of Solid Polymer Electrolyte Membrane for Fuel Cells
Molecular structure evaluation by TOF-SIMS and chemical state evaluation by XPS.
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[Analysis Case] Component Analysis of Hair Roots
Visualization of biological components such as cholesterol and fatty acids using TOF-SIMS.
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[Analysis Case] Observation of Pigment and Dye Dispersion
Micron-order imaging measurement using TOF-SIMS.
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[Analysis Case] Evaluation of the BSF Layer in Si-based Solar Cells
Impurity evaluation with in-plane distribution is possible using cross-sectional imaging SIMS.
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[Analysis Case] Comprehensive Evaluation of Organic EL Displays
We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.
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[Analysis Case] Evaluation of the Interface between the Alq3 Layer and the Emission Layer of Organic EL Devices
Degradation assessment by depth profiling using TOF-SIMS.
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[Analysis Case] Evaluation of pn Junction and Grain Structure of CIGS Film
Electron beam induced current method and crystal orientation analysis using SEM.
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[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS
It is possible to achieve high-precision measurements that are not affected by surface irregularities.
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[Analysis Case] Evaluation of Crystal Grains in CIGS Film
Crystal orientation analysis using SEM.
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[Analysis Case] Cross-Section Observation of Organic Thin-Film Solar Cells
Using low acceleration voltage STEM, slight density differences in organic films can be observed.
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