[Analysis Case] Evaluation of the Mixed State of the Active Layer in Organic Thin-Film Solar Cells

Evaluation of the distribution state of organic materials using low-energy STEM observation and EELS measurement.

last updated Mar 13, 2025

[Analysis Case] Three-Dimensional Observation of Lithium-Ion Secondary Battery Electrodes

Observation of filling degree and voids using Slice and View.

last updated Mar 13, 2025

[Analysis Case] Elemental Analysis of Active Materials in Lithium-Ion Secondary Batteries

Dismantling and sampling can be performed in a non-exposed atmospheric environment, allowing for measurements that minimize degradation and alteration.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Degradation of Lithium-Ion Battery Anode Surface

Measurements and observations will be conducted from pre-treatment to measurement without atmospheric exposure.

last updated Mar 13, 2025

[Analysis Case] Three-Dimensional Distribution Evaluation of Dopants in MEMS Using SIMS

Imaging SIMS allows for the visualization of concentration distributions of trace elements in micro-regions.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Layer Structure of Organic EL Devices

By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.

last updated Oct 03, 2025

What is a HAADF-STEM image?

HAADF-STEM: High-Angle Annular Dark Field Scanning Transmission Electron Microscopy

last updated Mar 12, 2025

[Analysis Case] Investigation of Defective Bipolar Transistors (IGBT)

Identification of failure locations using an emission microscope with a high voltage power supply.

last updated Mar 13, 2025

[Analysis Case] Depth Profile Analysis of Impurities in Organic EL Devices Using SIMS

Evaluate organic EL elements with good depth direction resolution.

last updated Mar 13, 2025

[Analysis Case] Observation of Heterojunction Interface in CIGS Thin-Film Solar Cells

Evaluation of the crystal structure of the high-resistance layer at the CdS/CIGS junction interface using ultra-high-resolution STEM.

last updated Mar 13, 2025

[Analysis Case] Resistance Evaluation of Heterojunction Interface in CIGS Solar Cells

Evaluation of local resistance distribution using scanning spreading resistance microscopy (SSRM) under vacuum.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Lighting Emitting Devices

We will conduct analysis of various materials, including the disassembly of LEDs, phosphors, and LED chips.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Composition Distribution in the Active Layer of Organic Thin-Film Solar Cells

Preprocessing and depth direction analysis are possible under controlled atmosphere conditions.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Diffusion Layer of Power Transistors (DMOSFET)

You can understand the positional relationship between the gate layer, source layer, and body layer.

last updated Mar 13, 2025

[Analysis Case] Analysis of Catalysts for Fuel Cells

Chemical state analysis using XPS and morphological observation using TEM.

last updated Sep 17, 2025

[Analysis Case] Evaluation of Solid Polymer Electrolyte Membrane for Fuel Cells

Molecular structure evaluation by TOF-SIMS and chemical state evaluation by XPS.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Hair Roots

Visualization of biological components such as cholesterol and fatty acids using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Observation of Pigment and Dye Dispersion

Micron-order imaging measurement using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the BSF Layer in Si-based Solar Cells

Impurity evaluation with in-plane distribution is possible using cross-sectional imaging SIMS.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Organic EL Displays

We evaluate by combining various methods such as structural understanding, material assessment, and identification of deterioration causes.

last updated Mar 13, 2025

[Analysis Case] Evaluation of the Interface between the Alq3 Layer and the Emission Layer of Organic EL Devices

Degradation assessment by depth profiling using TOF-SIMS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of pn Junction and Grain Structure of CIGS Film

Electron beam induced current method and crystal orientation analysis using SEM.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Interdiffusion Between Layers of CIGS Solar Cells Using SIMS

It is possible to achieve high-precision measurements that are not affected by surface irregularities.

last updated Oct 03, 2025

[Analysis Case] Evaluation of Crystal Grains in CIGS Film

Crystal orientation analysis using SEM.

last updated Mar 13, 2025

[Analysis Case] Cross-Section Observation of Organic Thin-Film Solar Cells

Using low acceleration voltage STEM, slight density differences in organic films can be observed.

last updated Mar 13, 2025

[Analysis Case] Comprehensive Evaluation of Lithium-Ion Secondary Battery Materials

We will conduct an evaluation that combines various methods to solve the problem.

last updated Mar 13, 2025

[Analysis Case] High-Sensitivity Analysis of Light Elements in Semiconductor Substrates Using SIMS

SIMS analysis allows for the evaluation of elements such as H, C, N, O, and F down to levels below 1 ppm.

last updated Oct 03, 2025

[Analysis Case] Observation of Crystal Structure of Multicomponent Metallic Nanoparticles by TEM

Ultra-high resolution STEM observation of InGaZnO4 particles

last updated Mar 13, 2025

[Analysis Case] Evaluation of the State of the Electrode/Organic Layer Interface in Organic EL Devices

The process will be carried out from pretreatment to XPS measurement under an inert gas atmosphere.

last updated Sep 17, 2025

[Analysis Case] Cross-sectional Observation of TEM/SEM Organic EL and Gate Oxide Film

Low-acceleration STEM observation allows for contrast even in low-density membranes.

last updated Mar 13, 2025