All products and services
241~270 item / All 737 items
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[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy
It is possible to obtain insights into the size and distribution of crystal grains in metallic polycrystals.
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[Analysis Case] Comparison of Secondary Electron Images of Cu Surface Using SEM and SIM
It is effective to differentiate between the two methods depending on the surface structure of interest.
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[Analysis Case] Structural Analysis of DRAM Chips using TEM and SEM
Reverse engineering of DRAM on the product's internal substrate.
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[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification
Evaluation of microscopic atomic structures is possible through computational simulation.
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[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations
Microscopic structural analysis of amorphous films is possible through simulation.
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[Analysis Case] SiC by SMM and SNDM
You can evaluate the p/n polarity and carrier concentration distribution of the diffusion layer in SiC devices.
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[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation
The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.
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[Analysis Case] Hair Component Analysis
It is possible to evaluate hair components according to the purpose.
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[Analysis Case] Evaluation of Surface Roughness of SiC Trench MOSFET Trench Sidewalls
Quantitative evaluation of the roughness of trench sidewalls related to device characteristics.
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[Analysis Case] Non-destructive 3D Structural Observation of SiC Discrete Packages
Non-destructive three-dimensional observation of the internal structure of a discrete package.
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[Analysis Case] De-gassing Analysis of Graphene Powder by TDS
It is possible to evaluate the outgassing caused by functional groups and impurities in carbon materials.
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Analysis case: Metal content analysis in a solution
High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.
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[Analysis Case] High Sensitivity Evaluation of SNDM's SiCMOS
The diffusion layer structure of SiC devices can be visualized (high-sensitivity evaluation of the diffusion layer structure).
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[Analysis Case] Damage Assessment of Single Crystal Si Surface
Quantitative analysis of c-Si and a-Si by state is possible using high-resolution measurement and waveform analysis.
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All applicants will receive a gift! Basics of surface analysis and examples of contract analysis.
<XPS・TOF-SIMS> A comprehensive explanation of what surface analysis is, the types of surface analysis, and other fundamental aspects. Additionally, representative examples using surface analysis are included.
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[Analysis Case] Evaluation of Composition Distribution of Ultra-Thin Films Using Angle-Resolved XPS (ARXPS)
It is possible to evaluate the depth profile of ultra-thin films on the substrate.
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[Analysis Case] Verification of Reduction Treatment for Sn Oxide
Comparison of XPS and computational simulations: Analysis of electronic states from the valence band spectrum.
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[Analysis Case] Evaluation of the Distribution of Drug Components Administered to the Eye
It is possible to process the eyeball and visualize the drug components (imaging).
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[Analysis Case] AFM Analysis of Smartphone Protective Films
Quantitative evaluation of the quality of sensory products is possible.
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[Analysis Case] Evaluation of Porosity Inside Polyurethane Using X-ray CT
Analysis case of porous resin materials using X-ray CT
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[Analysis Case] Comprehensive Evaluation of CMOS Sensors
Reverse engineering of smartphone components
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[Analysis Case] Quantification of Diacetyl in Beverages
The amount of diacetyl can be evaluated by GC/MS.
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[Analysis Case] Evaluation of Functional Groups in Graphene
Evaluation of functional groups in graphene is possible using thermal decomposition GC/MS method.
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Analysis case: Evaluation of the oxide film on the surface of solder balls.
Evaluation case of spherical shape samples
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AFM Data Collection
AFM: Atomic Force Microscopy Method
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[Analysis Case] Evaluation of Diffusion Layer Shape of Image Sensors Using SCM
We provide consistent support from sample disassembly to measurement.
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[Analysis Case] Analysis of Hydrogen Desorption from Stainless Steel by TDS
It is possible to evaluate the amount of hydrogen released from metals using TDS (Thermogravimetric Desorption Gas Analysis).
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[Analysis Case] Valence Evaluation of Trace Metals in Ceramic Materials
It is possible to evaluate trace metals in ppm orders.
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[Analysis Case] Stress Evaluation by Raman Mapping
It is possible to confirm the stress distribution in the sample cross-section.
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Analysis of organic acids by HPLC
HPLC: High-Performance Liquid Chromatography
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