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271~300 item / All 788 items
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Technical Data: Evaluation of Element Distribution and Chemical State of SEI Film on Secondary Battery Anode
Composite approach to the cross-sectional structure and surface shape of the negative electrode, as well as elemental mapping images of the active material cross-section!
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[Analysis Case] ESM-RISM Method LIB Electrolyte Component Simulation
Detailed illustrations of the schematic diagram near the electrolyte interface and the solvation structure in the electrolyte are provided!
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[Analysis Case] 3D Observation of Cosmetics Using X-ray CT and Cryo-SEM
It is possible to confirm the shape of emulsified particles and inorganic powders! Visualizing the film of liquid foundation from macro to micro levels.
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"Basics of TEM" "Applications and Case Studies of TEM" *A gift for all interested participants.
Basic knowledge and analysis examples of TEM (Transmission Electron Microscopy) used in a wide range of research and development fields such as polymers and semiconductors.
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[MFM] Magnetic Force Microscopy Method
MFM is a measurement technique that uses a probe coated with a magnetic film to measure the leakage magnetic field occurring near the sample surface and obtain magnetic information.
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"Basics and Examples of Non-Destructive Analysis Using X-rays and Ultrasound" *Presented to all interested parties.
Basic explanations of non-destructive analysis methods (ultrasonic microscopy and X-ray CT) and representative analysis cases are provided.
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[Analysis Case] Quantitative Analysis of Low Molecular Weight Siloxanes
We will quantify the siloxanes in the exhaust gas at the ng level.
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[Analysis Case] Measurement of Organic and Inorganic Carbon Content in Food
It is possible to evaluate the carbon content of organic and inorganic substances in solids.
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[Analysis Case] Non-destructive Analysis of Cosmetics
The internal structure of the product can be evaluated non-destructively using X-ray CT.
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[Analysis Case] Investigation of Voids Inside Bonded Wafers Using C-SAM
We will evaluate the internal structure of the device in a comprehensive manner.
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X-ray CT method
X-ray Computed Tomography
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[SXES] Soft X-ray Emission Spectroscopy
SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.
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[Analysis Case] Evaluation of Curing Degree of Polyimide Resin by FT-IR
By capturing changes in functional groups, it is possible to evaluate the imidization rate of the resin.
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[Analysis Case] Simultaneous Heating Analysis of Copper Plates and Solder by TDS
It is possible to evaluate degassing in an environment close to the actual process by bringing the materials into contact with each other.
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[Analysis Case] TDS Analysis of Epoxy Resin
It is possible to investigate the degassing behavior of organic matter in a vacuum.
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[Analysis Case] Tensile Test of Foam Rubber Using X-ray CT
Measurement and analysis of shape changes inside the sample in situ.
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[Analysis Case] Evaluation of Organic Component Desorption in a Vacuum
The temperature dependence evaluation of the desorption of specific organic components is possible through composite analysis.
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[Analysis Case] Non-destructive Observation of Lithium-ion Secondary Battery Internals
Case studies observed using X-ray CT.
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[Analysis Case] Evaluation of Curing Degree of Epoxy Resin by FT-IR
It is possible to evaluate the degree of curing of the resin by capturing changes in functional groups.
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[Analysis Case] Evaluation of Internal State of Transistor
We evaluate abnormalities inside the device non-destructively.
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[Analysis Case] Imaging Analysis of Pesticide Active Ingredients in Formulations
You can visualize the distribution of pesticide active ingredients and inorganic components in the formulation.
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[Analysis Case] Evaluation of Voids Inside Pancakes
Non-destructive observation of the internal structure of food using X-ray CT.
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[Analysis Case] Three-Dimensional Structural Observation and Membrane Thickness Analysis of Seamless Capsules
Evaluation and analysis of seamless capsules is possible using X-ray CT.
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[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy
It is possible to obtain insights into the size and distribution of crystal grains in metallic polycrystals.
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[Analysis Case] Comparison of Secondary Electron Images of Cu Surface Using SEM and SIM
It is effective to differentiate between the two methods depending on the surface structure of interest.
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[Analysis Case] Structural Analysis of DRAM Chips using TEM and SEM
Reverse engineering of DRAM on the product's internal substrate.
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[Analysis Case] Electronic State Evaluation of Wide Bandgap Semiconductor Dopant Site Identification
Evaluation of microscopic atomic structures is possible through computational simulation.
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[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations
Microscopic structural analysis of amorphous films is possible through simulation.
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[Analysis Case] SiC by SMM and SNDM
You can evaluate the p/n polarity and carrier concentration distribution of the diffusion layer in SiC devices.
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[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation
The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.
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