[Analysis Case] Evaluation of the Chemical State of RuO2 Catalyst using in-situ XAFS

Measurement is possible under the specified gas atmosphere and temperature conditions.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Metal Valence of Fuel Cell PtRu Catalyst Under Atmosphere and Temperature Control

Evaluation of chemical states under conditions where gas atmosphere and temperature are controlled is possible.

last updated Apr 02, 2026

[Analysis Case] Qualitative Analysis of Organometallic Complexes under Atmosphere Control

Mass spectrometry using TOF-SIMS is possible under conditions that are not affected by oxidation.

last updated Apr 02, 2026

[Analysis Case] Thermal Desorption Gas Analysis of Metal (Sn)

TDS analysis of low melting point metals

last updated Apr 02, 2026

[Analysis Case] Evaluation of "Water" in Quartz and Glass Using SIMS

Depth-direction analysis of hydrogen using 'heavy water (D2O) treatment'

last updated Apr 02, 2026

Analysis of trace metal elements in the environment

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

last updated Apr 02, 2026

[Analysis Case] Evaluation of Organic Contamination of Wafers in Wafer Cases

You can evaluate the causes and total amount of organic contamination in the manufacturing process.

last updated Apr 02, 2026

[Analysis Case] Band Gap Evaluation of Oxidized and Nitrided Thin Films

High-precision band gap evaluation is possible through combined analysis of XAFS and XPS.

last updated Apr 02, 2026

Examples of TDS analysis by representative materials and purposes

TDS: Thermal Desorption Gas Analysis Method

last updated Apr 02, 2026

[Analysis Case] Degassing Evaluation of Plating Samples

Thermal Desorption Gas Analysis of Ni/Au Plating (TDS)

last updated Apr 02, 2026

[Analysis Case] Peptide Sequence Analysis by LC/MS/MS

We will analyze the amino acid sequence of the peptide using LC/MS/MS analysis.

last updated Apr 02, 2026

Evaluation of metal contamination on the Si wafer surface

ICP-MS: Inductively Coupled Plasma Mass Spectrometry

last updated Apr 02, 2026

[Analysis Case] Analysis of Metal Contamination in SiN Films

High-sensitivity analysis using ICP-MS.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Transdermal Absorption of Indomethacin in Three-Dimensional Cultured Human Skin

Visualization of the distribution of active ingredients applied to cultured skin using TOF-SIMS.

last updated Apr 02, 2026

Shotgun analysis of proteins

LC/MS/MS: Liquid Chromatography-Mass Spectrometry

last updated Apr 02, 2026

[Analysis Case] Evaluation of Coating Film on Injection Needle Surface

Visualization of the distribution and coating condition of water-repellent films, coatings, and membranes.

last updated Apr 02, 2026

[Analysis Case] Analysis of organic fluorine compounds (PFOS, PFOA, etc.)

We can conduct analysis of products, wastewater, and environmental water.

last updated Apr 02, 2026

[Analysis Case] Analysis of Nonylphenol Ethoxylates in Fibers

Inspection of various fiber products made from different materials is possible.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Ion Implantation Damage in GaN by XAFS

It is possible to confirm the recovery of crystallinity due to irradiation defects and annealing.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Pharmaceutical Crystal Polymorphism

It is possible to evaluate the structure of crystalline polymorphs.

last updated Apr 02, 2026

[Analysis Case] Observation of Hair Surface Microstructure by AFM

Quantitative evaluation with reduced alteration is possible through analysis in the atmosphere.

last updated Apr 02, 2026

[Analysis Case] Atomic Resolution Analysis of Lithium-Ion Secondary Battery Cathode Materials

Atmosphere control + atomic-level observation under cooling

last updated Apr 02, 2026

[Analysis Case] Local Structure Analysis of Aluminum Oxide Thin Films

It is possible to capture changes in the fine structure of the film due to differences in film formation conditions.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Gold Thin Film Adhesion on Wafer by XRF

Comparison of the amount of thin film components adhered between samples.

last updated Apr 02, 2026

[Analysis Case] In-plane film thickness evaluation of Au thin film on wafer using XRF.

Visualization of film thickness distribution through multi-point mapping measurement.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Nitrogen Substitution Positions in Nitrogen-Doped Carbon Materials

It is possible to identify the substitution position of nitrogen and achieve quantitative separation using chemical shifts.

last updated Apr 02, 2026

[Analysis Case] Quantitative Analysis of the Sugar Composition of Fucoidan

We can accommodate various sample forms such as powders and liquids.

last updated Apr 02, 2026

[Analysis Case] De-gassing Analysis of Hydrogen Terminal Wafers

The hydrogen in the outermost single atomic layer can be evaluated using TDS.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Interstitial Carbon in Si Substrate Using Low-Temperature PL and SIMS Analysis

It is possible to confirm the trace amounts of carbon contained in the Si substrate.

last updated Apr 02, 2026

[Analysis Case] Evaluation of Si-based IGBT Chip Cross-section by Low-Temperature Micro Photoluminescence Analysis

It is possible to confirm the influence of the lifetime killer from the cross-sectional direction.

last updated Apr 02, 2026