一般財団法人材料科学技術振興財団 MST Official site

[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy

It is possible to obtain insights into the size and distribution of crystal grains in metallic polycrystals.

The Scanning Ion Microscope (SIM) is a method that irradiates a solid sample with an ion beam and detects the secondary electrons generated. Since secondary electrons produce contrast according to the crystal orientation of each grain, it is possible to easily obtain insights into the size and distribution of crystal grains in polycrystalline metals such as Cu and Al using SIM. This document presents an example of measurements where the surface of Cu was observed using SIM.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/49…

basic information

For detailed data, please refer to the catalog.

Price information

-

Delivery Time

Applications/Examples of results

Analysis of LSI and memory.

[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy_C0545

TECHNICAL

Recommended products

Distributors