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[MFM] Magnetic Force Microscopy Method

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[MFM] Magnetic Force Microscopy Method

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MFM is a measurement technique that uses a probe coated with a magnetic film to measure the leakage magnetic field occurring near the sample surface and obtain magnetic information.

- Qualitative information on the magnetic properties of the sample can be obtained. - Imaging of attraction and repulsion due to leakage magnetic fields is possible. - A signal of magnetic force proportional to the magnitude of the gradient of the leakage magnetic field can be obtained, but quantitative evaluation is not possible. - AFM images can also be obtained simultaneously.

Related Link - https://www.mst.or.jp/method/tabid/1373/Default.as…

basic information

For detailed data, please refer to the catalog.

Price information

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Applications/Examples of results

- High-density recording media: Transition areas and edges of hard disks, floppy disks, magneto-optical disks, magnetic tapes, etc. - Magnetic heads: Observation of gaps in thin-film heads, GMR, MR heads, MIG heads, etc., as well as permalloy, garnet, etc. - Observation of magnetic domains in soft materials - Observation of ferromagnetic materials such as rare earth magnets

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MST is a foundation that provides contract analysis services. We possess various analytical instruments such as TEM, SIMS, and XRD to meet your analysis needs. Our knowledgeable sales representatives will propose appropriate analysis plans. We are also available for consultations at your company, of course. We have obtained ISO 9001 and ISO 27001 certifications. Please feel free to consult us for product development, identifying causes of defects, and patent investigations! MST will guide you to solutions for your "troubles"!

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