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[Analysis Case] Evaluation of Internal State of Transistor

We evaluate abnormalities inside the device non-destructively.

In order to investigate the causes of device failures that cannot be identified through visual inspection, non-destructive evaluation methods such as X-ray CT may be necessary. Using X-ray CT, we measured the faulty transistor and checked its internal condition. As a result, we confirmed a wire breakage, and it was also found that the mold resin surrounding the broken wire had deteriorated due to heat and other effects at the time of the breakage.

Related Link - https://www.mst.or.jp/casestudy/tabid/1318/pdid/50…

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Analysis of electronic components.

[Analysis Case] Evaluation of Internal State of Transistor_C0563

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