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[SXES] Soft X-ray Emission Spectroscopy

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[SXES] Soft X-ray Emission Spectroscopy

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A0053.jpg 打ち合わせ.jpg セミナー.jpg

SXES is a method that evaluates the chemical bonding state using soft X-rays emitted from materials.

- It is possible to evaluate the chemical bonding states focusing on specific elements in the sample (especially light elements such as B, C, N, O). - The spectral shape reflects the partial density of states of the targeted elements in the valence band. - Evaluation of the band structure is also possible through simultaneous measurement with X-ray absorption spectroscopy (XAS). - Since information from the bulk is obtained, it is less affected by the influence of the surface region within a few nanometers. - Evaluation can be performed without being affected by charging effects, even for insulators. - The detection limit is low (<1 atomic%), allowing for the evaluation of trace components.

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basic information

We use synchrotron radiation as an excitation source with characteristics such as variable energy and high intensity to generate luminescence.

Price information

The price varies depending on the measurement target, so please feel free to contact us.

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Applications/Examples of results

- Evaluation of gap states in dilute magnetic semiconductor Ga1-xCrxN - Local structure analysis of trace boron in HOPG (highly oriented pyrolytic graphite) - Evaluation of chemical bonding states of trace light elements in oxide semiconductors - Band structure evaluation of various thin film samples (combined analysis with XAS)

Detailed information

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