Maximum 800µm long stroke objective focus P-725.xCDE2
Sub-nanometer resolution, maximum operation of 800 µm, high-speed and high-precision PIFOC(R) focus scanner.
The P-725.xCDE2 is a focus scanner for objective lenses that employs a flexure guide structure and PICMA® piezo technology. The capacitive sensor achieves sub-nanometer resolution and 0.02% linearity, maintaining high precision even with long strokes of 100 / 400 / 800 µm. With zero wear parts and no need for lubrication, it offers a long lifespan. It contributes to the acceleration of Z-step in confocal and multiphoton microscopy as well as semiconductor inspection. *For more details, please download the PDF or contact us.
basic information
- Stroke: 100µm, 400µm, 800µm - Built-in capacitive sensor - Optimal for high-dynamics operation due to high rigidity - Flexibility of the cable - Wide range of installation methods *For more details, please download the PDF or contact us.*
Price range
Delivery Time
Model number/Brand name
P-725.xCDE2
Applications/Examples of results
- Various types of microscopes (confocal, light sheet, super-resolution, two-photon, etc.) - 3D imaging - Screening - Interferometric measurement devices - High-precision measurement - Autofocus system - Biotechnology - Semiconductor inspection, etc.
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Line up（3）
| Model number | overview |
|---|---|
| P-725.1CDE2 | PIFOC piezo nanofocusing system for long travel ranges and fast step-and-settle, 100 µm, capacitive sensors, D-sub connectors |
| P-725.4CDE2 | PIFOC piezo nanofocusing system for long travel ranges and fast step-and-settle, 400 µm, capacitive sensors, D-sub connectors |
| P-725.8CDE2 | PIFOC piezo nanofocusing system for long travel ranges and fast step-and-settle, 800 µm, capacitive sensors, D-sub connectors |
