プレシテック・ジャパン Official site

Introducing the measurement principles of each sensor, corresponding sensors, product information, and ease of use!

For more details, please refer to the PDF document or feel free to contact us.

In addition to the conventional chromatic aberration confocal method and spectral interference method, a thickness measurement sensor utilizing laser heating has also emerged. It can measure the thickness of both transparent and opaque materials non-contactly.

**Principle** Our products mainly have three types of measurement principles. ■ Chromatic Aberration Confocal Primarily used for measuring surface shapes, but can also be utilized for measuring the thickness of transparent materials. While it is less accurate than spectral interference methods, it is recommended if you are looking for a cost-effective thickness measurement. ■ Spectral Interference Method Mainly used for thickness measurement. It enables high-precision measurements at the sub-micron level, leveraging the strengths of the spectral interference method. High-speed measurements necessary for in-situ, monitoring, or inline applications are possible. ■ Method Utilizing Laser Heating (Sensors from Enovasense) Heats the target object with a laser diode. It takes advantage of the fact that the speed of heat propagation differs depending on thickness. Using a proprietary algorithm, it detects the radiant heat from the target object and converts it into thickness. **Product Lineup** - Single Point Sensors Available in high-precision types as well as more affordable options under 1 million yen. - Line Sensors Using chromatic aberration confocal technology, it can perform full-area measurements in conjunction with an operating stage. - Area Scanner Sensors A type that can perform area scans with a two-axis galvanometer. There are also area scanners that do not require an operating stage and are unaffected by vibrations.

Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.

【Application】 Non-contact 3D shape measurement is possible. It is also possible to replace contact methods with non-contact methods. ■ Home Appliances (Smartphones) - LCD glass - OLED mask inspection - Fine scratches and other surface defects - Wire bonding - AR glasses ■ Semiconductor Manufacturing Process - Wafer edge shape measurement - Wafer edge defect inspection - Wafer dicing groove appearance inspection - BGA inspection - IC package and circuit inspection ■ Automotive - Valve inspection - Car interior - Glass inspection - Inspection of airbag welding beads

An all-in-one scanner that can weld workpieces under optimal conditions through ultra-fast shape recognition.

Wavelength range: 1030 to 1080 nm Maximum output: 6kW (CW) Collimator: Fc = 100, 125, 150 mm Focus: Ff = 255, 340, 460 mm [Keywords: Applications, Measurement items, Benefits, etc.] Disk laser, fiber laser, YAG fundamental wave, Disk, Fiber, Scanner, remote welding, seam tracking, seam search, welding monitor, FocusFinder

It is possible to obtain the quality assessment results of the product simultaneously with the completion of laser welding. It is equipped with a user-friendly GUI that facilitates easy operations such as data linking, review, and analysis.

<Sensor> - Compact Sensor: Analog sensor for fundamental wave - Digital Sensor: Available for fundamental wave, as well as green and blue <Control Device Shapes> - LWM Standard: Full-size cabinet - LWM Compact: Mid-size case - LWM OEM: Mounting plate for 19-inch rack - LWM Base: Control equipment only (requires assembly) [Keywords for Applications, Measurement Items, Benefits, etc.] Disk laser, fiber laser, diode laser, green laser, blue laser, YAG, fundamental wave, second harmonic, third harmonic, Disk, Fiber, LD, LDD, fixed optical head, scanner, solid-state laser, scanner, time-sharing, 250kHz

Non-contact optical thickness measurement. Applicable even for thickness measurements of semiconductor wafers where high precision is required.

【Other Features】 ■Measurement Range: 32μm to 3900μm (n=1, Linearity 1μm) 16μm to 1900μm (n=1, Linearity 0.35μm) ■Resolution: Up to 1nm (n=1) ■Measurement Frequency: 70kHz ■Interface: Ethernet, RS422, Analog (2ch) *For more details, please refer to the PDF document or feel free to contact us.

Rich experience in flatness measurement in high-temperature environments, foreign matter inspection during manufacturing processes, edge shape inspection of button batteries, and measurement of separator thickness and coating thickness, etc.!

【Examples of Use】 ■ Measurement of battery flatness (proven results in special environments such as high temperatures) ■ Foreign matter inspection during the manufacturing process ■ Measurement of separator thickness ■ Weld seam inspection ■ Coating thickness ■ Inspection of button battery edge shapes, etc. *For more details, please refer to the materials. Feel free to contact us with any inquiries.