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  • SEMINAR_EVENT

Nepcon Japan 2025

プレシテック・ジャパン

プレシテック・ジャパン

We will be exhibiting at NEPCON Japan, held at Tokyo Big Sight from January 22 to 24, 2025. If you are interested, please feel free to visit our booth. ■ Products to be exhibited - Spectral interference thickness sensor CHRocodile 2IT - Area scanner FSS80 - Chromatic aberration confocal sensor CHRocodile Mini - Chromatic aberration confocal line sensor CLS2 - Chromatic aberration confocal line camera CVC - Thickness measurement sensor for opaque materials Enovasense - Area sensor for internal defect inspection Field sensor

  • Date and time Wednesday, Jan 22, 2025 ~ Friday, Jan 24, 2025
    10:00 AM ~ 05:00 PM
  • Capital 39th ElectroTest Japan - Electronics Inspection, Testing, and Measurement Exhibition Tokyo Big Sight East Hall 2, Booth Number #E14-18
  • Entry fee Free

Related catalog

High-power light source equipped CHRocodile 2S HP - Thickness measurement/Shape measurement

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Non-contact small single-point sensors 'CHRocodile C' and 'CHRocodile Mini'

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Welding Internal Defect Measurement Sensor Enovasense Field Sensor

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Laser photo-thermal thickness measurement and internal defect inspection Enovasense field sensor

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Case studies, applications, and measurement overview materials for Enovasense's laser photo-thermal sensors.

TECHNICAL