Non-contact small optical distance sensor [CHRocodile C/Mini]
Affordable distance sensors for measuring film and coating thickness, as well as non-contact thickness measurement. Strong performance on slopes, achieving a distance direction resolution of 20nm!
Our optical distance sensor/thickness sensor 'CHRocodile C / CHRocodile Mini' from PreciTech Japan is a compact non-contact sensor with a wide measurement range. It is robust against slopes and offers high resolution in the distance direction starting from 20nm, all at an affordable price of approximately 1 million yen (excluding tax). 【Examples of Use Cases】 ● Complete inspection through height and distance measurement of manufactured products within equipment ● Quality improvement through thickness management of glass, film, and graphite coatings ⇒ Adopted by manufacturers of production equipment, inspection equipment, and integrators. 【Features】 ・Combines high resolution with a price point that lowers the purchasing barrier ・Non-contact measurement of film and coating thickness ・Strong against slopes with an angle tolerance of up to ±45 degrees ・Distance direction resolution starting from 20nm ・Flexible software creation possible with the provided software development kit ・Can be embedded in equipment ・Compatible with rough and mirror surfaces, independent of surface or shape *For product details, please refer to the materials available for download in PDF format. Feel free to contact us for inquiries.
basic information
【CHRocodile C】Low footprint probe-integrated type ■Features - Scan rate: 4 kHz - Light source: White LED light source - Measurement range: 5 types from 200 µm to 10 mm - Thickness measurement capable of measuring single layer and multiple layers (up to 3 layers) - Synchronous I/O function included - Interface: Ethernet/RS422 - HS (high sensitivity model) available - External box capable of capturing encoder and 2-channel analog input - External dimensions: 99 x 65 x 47 mm (without probe) - Weight: 440 g ■Features 【CHRocodile Mini】Space-saving separate probe type - Scan rate: 4 kHz (optional 10 kHz) - Light source: White LED light source - Measurement range: 2 types of 4 mm and 10 mm - Thickness measurement capable of measuring single layer and multiple layers (2 layers, optional 4 layers) - Synchronous I/O function included - Interface: Ethernet/RS422 - Mini+ model supports 2-channel analog output and 3-axis encoder input - External dimensions: 95 x 106 x 95 mm (controller) - Weight: 500 g (Mini+ is 550 g)
Price range
P4
Delivery Time
OTHER
Model number/Brand name
CHRocodile C, CHRocodile Mini
Applications/Examples of results
- Full inspection of manufactured products through height and distance measurement within the device - Quality improvement through management of glass and film thickness, etc. 【Keywords: Applications, Measurement Items, Benefits, etc.】 Non-contact sensors, optical sensors, confocal, thickness, height, surface roughness, flatness, TTV, shape, measurement, inspection, high speed, 3D, small, compact, inexpensive, low cost, high precision, inline, monitoring, in-situ, during processing, before and after processing, polishing, offline, standalone machines, tabletop machines, sampling, embedded, semiconductors, wafers, Si wafers, CMM, weld joints, glass, quartz glass, silicate glass, PCB, medical balloons, films, PET films, coatings, multilayer films, applied films, conformal coatings, PVB, resin materials, adhesives, transparent, transparent bodies, black, glossy, mirror finish, easy.
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Semicon Japan 2024
We will be exhibiting at Semicon Japan 2024, which will be held at Tokyo Big Sight from December 11 (Wednesday) to December 12 (Friday). If you are interested, please come to the venue. ■ Products to be exhibited 1. Spectral interference optical thickness sensor CHRocodile 2 DW/ 2IT 2. Area scanner for measuring the thickness and shape of 12" wafers - Flying Spot Scanner (FSS) 3. Chromatic aberration confocal optical line sensor CLS2.0 4. Chromatic aberration confocal line camera CVC 5. Chromatic aberration confocal optical single-point sensor CHRocodile Mini 6. Non-contact thickness measurement sensor for opaque materials Enovasnese 7. Sensor for detecting internal defects non-contactly - Field sensor
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The 1st Kyushu Semiconductor Industry Exhibition
We will be exhibiting at the Kyushu Semiconductor Industry Exhibition held at Marine Messe Fukuoka on September 25 (Wednesday) and September 26 (Thursday), 2024. If you are interested, please come to the venue. ■ Products to be exhibited - Spectral interference optical thickness sensor CHRocodile 2 DW/2IT - Chromatic aberration confocal optical line sensor CLS2.0 - Chromatic aberration confocal optical single-point sensor CHRocodile 2S, C, Mini *This time, there will be no actual display of the FSS for 12" wafer thickness mapping measurement, but if you need an explanation or would like to request a demo, please come to our booth.
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Nepcon Japan 2025
We will be exhibiting at NEPCON Japan, held at Tokyo Big Sight from January 22 to 24, 2025. If you are interested, please feel free to visit our booth. ■ Products to be exhibited - Spectral interference thickness sensor CHRocodile 2IT - Area scanner FSS80 - Chromatic aberration confocal sensor CHRocodile Mini - Chromatic aberration confocal line sensor CLS2 - Chromatic aberration confocal line camera CVC - Thickness measurement sensor for opaque materials Enovasense - Area sensor for internal defect inspection Field sensor