3D Measurement - Line Sensor 'CHRocodile CLS'

High-speed and wide-range 3D shape measurement with sub-micron accuracy. Features a wide tolerance angle that can accommodate edges and slopes. Suitable for wafer inspection applications as well.

last updated Apr 11, 2022

Presitech Japan Co., Ltd. Company Profile

Specialist in laser material processing and optical measurement technology!

last updated Mar 30, 2022

New color aberration confocal sensor 'CHRocodile MPS 2L'

No damage, deformation, or impact on shape to the sample! Compatible with hot end processes as well.

last updated Dec 19, 2019

Introduction of sensors for battery manufacturing and component inspection.

Introducing the measurement principles of each sensor, corresponding sensors, product information, and ease of use!

last updated Mar 30, 2022

Quality inspection and continuous correction for the glass industry.

It is possible to visualize various defects of bulk materials in the production process.

last updated Mar 30, 2022

High-speed and flexible glass thickness measurement

High flexibility and efficiency! The measurement points are spread along a line with a maximum length of 12.5 mm.

last updated Mar 30, 2022

High-precision non-contact thickness measurement device [for semiconductor wafers]

Achieves high-resolution shape measurement. A wide variety of sensor probes are available. Inline measurement of flatness and thickness is also possible. Suitable for wafer inspection applications.

last updated Mar 30, 2022

High-speed and high-precision measurement of batteries and accumulators with sub-micron resolution.

Rich experience in flatness measurement in high-temperature environments, foreign matter inspection during manufacturing processes, edge shape inspection of button batteries, and measurement of separator thickness and coating thickness, etc.!

last updated Mar 30, 2022

3D Line Sensor CHROCODILE CLS2 Series

Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.

last updated Mar 25, 2025

Non-contact measurement device for batteries, laser welding monitoring system.

Area sensor for internal defect inspection after welding as a substitute for X-rays, with over 15,000 units of monitoring systems during welding in operation.

last updated Aug 01, 2024