Thickness measurement - Optical sensor 'CHRocodile 2IT series'

Thickness measurement of various materials, capable of handling both during and after processing across a wide measurement range with a single device! Also suitable for wafer inspection applications.

last updated Mar 30, 2022

Thickness measurement - Optical sensor 'CHRocodile 2DW series'

Use an appropriate light source wavelength for doped wafers to accommodate challenging doped wafer thickness measurements.

last updated Mar 30, 2022

Presitech Japan Co., Ltd. Company Profile

Specialist in laser material processing and optical measurement technology!

last updated Mar 30, 2022

CHRocodile 2IT DW1000

Introducing the CHRocodile 2IT DW1000 with analog I output!

last updated Mar 30, 2022

CHRocodile 2DPS＋CHRocodile 2IT

Introduction of wafer thickness measurement sensors for semiconductor in-process applications!

last updated Mar 30, 2022

[Data] Non-contact thickness and shape measurement sensor

Many measurement examples are included! We are introducing CHRocodile's applications for semiconductors.

last updated Mar 30, 2022

[Information] Introduction to the CHRocodile Series

We are publishing information about non-contact thickness and shape measurement sensors!

last updated Mar 30, 2022

Control of CMP processes and grinding processes in the semiconductor industry.

The "CHRocodile 2 IT sensor" can measure the thickness of wafers during work processing.

last updated Mar 25, 2025

[Data] Products for consumer electronics manufacturing processes

For consumers! We feature shape and thickness inspection using color aberration line sensors.

last updated Mar 30, 2022

Introduction of Presitech, a non-contact sensor manufacturer.

A non-contact sensor manufacturer skilled in measurements using color aberration confocal methods and spectral interference methods. Strong in high-speed and high-precision thickness and shape measurements. Capable of handling various materials!

last updated Jul 05, 2022

High-speed and high-precision thickness measurement and shape measurement! Precitech non-contact sensors.

A non-contact sensor manufacturer skilled in measurements using chromatic aberration confocal method and spectral interference method. Strong in high-speed and high-precision thickness and shape measurements. Capable of handling various materials!

last updated Jul 28, 2022

High-speed and high-precision thickness measurement! Precitech non-contact sensor.

In addition to the conventional chromatic aberration confocal method and spectral interference method, a thickness measurement sensor utilizing laser heating has also emerged. It can measure the thickness of both transparent and opaque materials non-contactly.

last updated Mar 25, 2025

SEMI-compliant 12-inch wafer thickness and shape measurement system

12" wafer full inspection accelerated, can also be used for full inspection of wafers.

last updated May 30, 2025