[Data] Non-contact thickness and shape measurement sensor
Many measurement examples are included! We are introducing CHRocodile's applications for semiconductors.
This document provides information about non-contact thickness and shape measurement sensors. It introduces topics such as "The Principle of the CHROMATIC VISION CAMERA," "Measurement Examples," and "Features and Advantages of CHRocodile." Please take a moment to read it. 【Contents (Excerpt)】 ■ White Light Sensor ■ CHRocodile C ■ Interference Sensor ■ CHROMATIC VISION CAMERA ■ FLYING SPOT SCANNER *For more details, please refer to the PDF document or feel free to contact us.
basic information
【Other Publication Contents (Excerpt)】 ■Example 1: Si thickness measurement data during wafer in-process: Spectroscopic interference type Si thickness ■Advantages of wafer in-situ process based on the principle of spectroscopic interference ■Example 2: Si thickness measurement data during wafer in-process: Step height (thickness) using chromatic aberration confocal ■Advantages of wafer in-situ process based on the principle of chromatic aberration confocal ■Measurement Example 3: Shape measurement of bump wafers *For more details, please refer to the PDF document or feel free to contact us.
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