Small optical thickness/distance measurement sensor 'CHRocodile C'

Recommended inexpensive type focused on cost. Sensors for thickness measurement and distance measurement. Also suitable for wafer inspection applications.

last updated Mar 30, 2022

Presitech Japan Co., Ltd. Company Profile

Specialist in laser material processing and optical measurement technology!

last updated Mar 30, 2022

Chromatic Aberration Confocal Sensor 'CHRocodile C'

Accurate and stable measurements even at a maximum tilt of ±45°! Compatible with all surfaces.

last updated Mar 30, 2022

CHRocodile 2DPS＋CHRocodile 2IT

Introduction of wafer thickness measurement sensors for semiconductor in-process applications!

last updated Mar 30, 2022

[Data] Non-contact thickness and shape measurement sensor

Many measurement examples are included! We are introducing CHRocodile's applications for semiconductors.

last updated Mar 30, 2022

[Information] Introduction to the CHRocodile Series

We are publishing information about non-contact thickness and shape measurement sensors!

last updated Mar 30, 2022

Introduction of sensors for battery manufacturing and component inspection.

Introducing the measurement principles of each sensor, corresponding sensors, product information, and ease of use!

last updated Mar 30, 2022

Taking measurement technology to the next level.

Improvement of process and quality assurance using high-end chromatic aberration confocal sensors.

last updated Mar 30, 2022

In-process measurement of wafer step height

The "CHRocodile 2 DPS color aberration confocal sensor" is equipped with two independent measurement channels.

last updated Mar 30, 2022

[Data] Products for consumer electronics manufacturing processes

For consumers! We feature shape and thickness inspection using color aberration line sensors.

last updated Mar 30, 2022

Non-contact thickness measurement optical sensor "CHRocodile 2 Series"

A wide range of probes that can measure with high precision from thin films (a few micrometers) to thick films (780 micrometers). Suitable for wafer inspection applications as well.

last updated Mar 30, 2022

3D Line Sensor CHROCODILE CLS2 Series

Non-contact line sensor CLS. High precision, high speed, and wide range 3D shape measurement. High tolerance for angles suitable for edges and slopes. Numerous achievements in wafer edge measurement.

last updated Mar 25, 2025

Surface roughness measurement using optical sensors manufactured by Presitech.

The CHROMATIC LINE SENSOR (CLS) enables color aberration confocal measurement along a line.

last updated Jun 15, 2022

Non-contact small optical distance sensor [CHRocodile C/Mini]

Affordable distance sensors for measuring film and coating thickness, as well as non-contact thickness measurement. Strong performance on slopes, achieving a distance direction resolution of 20nm!

last updated Mar 25, 2025

Non-contact measurement device for batteries, laser welding monitoring system.

Area sensor for internal defect inspection after welding as a substitute for X-rays, with over 15,000 units of monitoring systems during welding in operation.

last updated Aug 01, 2024

Vial Measurement Application Document

Ideal for automatic inspection of vial shape and thickness - High-speed, high-precision optical sensor.

last updated Mar 25, 2025

Optical single-point sensor using chromatic aberration confocal method

Embedded optical sensor for high-precision and high-speed measurement of thickness and shape.

last updated Mar 25, 2025