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Taking measurement technology to the next level.

Improvement of process and quality assurance using high-end chromatic aberration confocal sensors.

To meet the need for speeding up production processes, data from ultra-fast inline measurements is essential. Such technology requires non-contact, high precision, as well as robustness, high reliability, and high-resolution 3D imaging. Our "Chromatic Aberration Confocal Sensor" can meet these requirements. Equipped with high-performance optical lenses, our chromatic aberration confocal sensor focuses not at a single point but at multiple distances along the optical axis, allowing it to focus across all wavelengths of visible light. This multifunctional optical sensor opens up new dimensions in measurement technology. In addition, we also offer products such as the "CLS-C Line Sensor," "C Point Sensor," and "Chromatic Aberration Point Sensor." 【Features】 ■ Capable of measuring various materials: transparent/opaque, diffuse/reflective surfaces, absorbing surfaces, etc. ■ Prevention of shadowing effects through coaxial measurement ■ Wide tolerance and high NA allow for measurements at up to 45° on reflective surfaces and over 80° on diffuse surfaces ■ Ultra-fast multi-point line sensor enables parallel measurement of multiple points *For more details, please refer to the PDF document or feel free to contact us.

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【Other Features】 ■ Ultra-high resolution and ultra-high precision in the Z-axis: No Z-axis scanning required for obtaining measurement values                Measurement values obtained from all measurement points ■ Small and consistent spot diameter with high lateral resolution ■ No moving parts or embedded electronic components due to the optical probe, achieving high thermal stability, long-term reliability, and reproducibility *For more details, please refer to the PDF document or feel free to contact us.

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[Keywords: Applications, Measurement Items, Benefits, etc.] Non-contact, optical sensor, confocal, spectral interference method, thickness, thin film, thick film, gap, height, surface roughness, flatness, TTV, shape, appearance, edge, slope, measurement, inspection, high speed, 3D, line sensor, line scan, area scan, full surface, compact, inexpensive, high precision, inline, monitoring, in-situ, during processing, before and after processing, polishing, offline, tabletop machine, sampling, embedded, semiconductor, wafer, wafer bonding, Si wafer, Si, GaAs, InP, SiC, LiNbO3 (LN), LiTaO3 (LT), GaN, SiP, Al2O3 (sapphire), CMM, weld joint, glass, quartz glass, silica glass (medical ampoules), display glass, car windshield, PCB, medical balloon, barrier film, PET film, coating, film, multilayer film, applied film, conformal coating, electrode layer coating, stent coating, polyimide, PVB, resin material, flux, adhesive, insulating film, air layer, dicing groove, flip chip, wire bond, micro bump, transparent, transparent body, black, glossy, mirror finish, easy.

Taking measurement technology to the next level.

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