TAKAYA Corporation Official site

  • SEMINAR_EVENT

Learn about the latest trends in JTAG testing technology! Invitation to the Boundary Scan Public Research Meeting (Online Seminar on 9/25) [Industrial Equipment Division]

TAKAYA Corporation

TAKAYA Corporation

On September 25 (Monday), a Boundary Scan Public Research Meeting (online seminar) will be held, where Mr. Taniguchi from Andor System Support Co., Ltd. and Mr. Yanagida from Takaya Co., Ltd. will jointly give a presentation. Details can be found in the related PDF document. We encourage everyone to tune in. <Keynote Speech> "Revolution in Semiconductor Packaging in the Chiplet Era" Mr. Yasumitsu Orii, Executive Vice President, Rapidus Corporation <Presentation 1> "Testing and Evaluation of Chiplets Using Boundary Scan" Mr. Shuichi Kameyama, Ehime University <Presentation 2> "Hybrid Testing with Flying Probe Testers and JTAG Testing" Mr. Masazumi Taniguchi, Andor System Support Co., Ltd. Mr. Koki Yanagida, Takaya Co., Ltd. <Presentation 3> "BGA Reliability Evaluation in HALT Testing through Collaboration of Boundary Scan Testing and CAE" Mr. Yu Maezawa, Advanced Mechanics Simulation Research Institute Co., Ltd.

  • Date and time Monday, Sep 25, 2023
    01:30 PM ~ 04:50 PM
    Online research meeting (Zoom)
  • Entry fee Charge Please apply for participation via the link.

Related Documents

Related catalog

Flying Probe Tester APT-1340J/APT-1400F-SL

PRODUCT

Dual-Side Flying Probe Tester APT-1600FD

PRODUCT