Electromagnetic Wave Noise Measurement and Analysis Device EMI Tester
Introducing a noise measurement and analysis device that automatically measures the noise distribution of electric and magnetic fields generated by electronic devices with high precision, capturing every source of electromagnetic noise.
Introducing the EMI Tester, an electromagnetic noise measurement and analysis device manufactured by Peritec. The EMI Tester automatically measures the noise distribution of electric and magnetic fields generated by electronic devices with high precision. The high-precision movable table can automatically trace complex shapes, such as those found in PCBs and ICs, and measure them with high sensitivity. Additionally, the measured data is visualized using a variety of 3D graphics (dedicated analysis software is included). 【Features】 ■ Simultaneous detection of near electric and magnetic fields, enabling continuous measurement (EMV-200) ■ Capable of high sensitivity and high-resolution measurements ■ Magnetic field measurement independent of wiring direction through probe rotation ■ Multifunctional display of measurement results ■ High-precision probe movement mechanism ■ Convenient features ■ Compatibility with a variety of probes ■ Proven track record in many companies
basic information
【New Feature Options】 ■Camera Image Overlay It is possible to take a photograph of the measurement target with a camera installed on the device at the start of measurement and display it overlaid with the distribution map of the measured electric and magnetic fields. ■Data Link with DEMITASNX It is possible to overlay the distribution map of magnetic field data measured with the EMI tester with the CAD data used in DEMITASNX (NEC). ■Time Domain Analysis (APD) Amplitude Probability Distribution (APD) measurements can now be performed simultaneously across multiple channels, contributing to the analysis of the relationship between electromagnetic wave noise sources and communication quality. ■Simultaneous Measurement of Electromagnetic Fields Using an electromagnetic field simultaneous measurement probe, it is possible to analyze both electric and magnetic fields of EMI in the vicinity of sub-devices simultaneously.
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Line up（4）
| Model number | overview |
|---|---|
| EMV-200 | |
| EMV-100 | |
| EMV-150 | This is an EMI tester capable of measuring a wider range than the EMV-100. |
| EMI-360 | This system visualizes the distribution of electromagnetic noise generated by electronic devices on a 3D screen by combining an electromagnetic noise measurement system with a motion camera. |
